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2015 | 128 | 3 | 414-418
Article title

Effect of Pulsed Laser Power Annealing on Structural and Optical Characteristics of ZnSe Thin Films

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EN
Abstracts
EN
Samples of ZnSe of the same film thickness (320 nm) have been thermally evaporated on unheated quartz substrates using high purity powder. The prepared films were subjected to pulsed laser annealing of two different powers. X-ray diffraction studies revealed that the as-deposited samples were polycrystalline cubic (zinc-blende type) structure. As the annealing power increases, the crystallinity of ZnSe films was improved with preferential orientation along the (111) direction parallel to the substrate surface. Microstructural characterizations have been evaluated using the Debye-Scherrer formula. The absorption coefficient as well as the energy gap for the as-deposited and the annealed samples were also reported.
Keywords
Year
Volume
128
Issue
3
Pages
414-418
Physical description
Dates
published
2015-09
received
2014-03-19
(unknown)
2015-04-11
(unknown)
2015-08-04
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv128n331kz
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