Effect of Pulsed Laser Power Annealing on Structural and Optical Characteristics of ZnSe Thin Films

• Authors: S. Aly , Alaa Akl , H. Howari
• Languages of publication: EN

Abstracts

EN

Samples of ZnSe of the same film thickness (320 nm) have been thermally evaporated on unheated quartz substrates using high purity powder. The prepared films were subjected to pulsed laser annealing of two different powers. X-ray diffraction studies revealed that the as-deposited samples were polycrystalline cubic (zinc-blende type) structure. As the annealing power increases, the crystallinity of ZnSe films was improved with preferential orientation along the (111) direction parallel to the substrate surface. Microstructural characterizations have been evaluated using the Debye-Scherrer formula. The absorption coefficient as well as the energy gap for the as-deposited and the annealed samples were also reported.

Keywords

EN

81.15.-z; 68.55.jd; 68.55.ag; 78.70.Ck; 81.15.Dj; 78.20.-e

Discipline

• 78.70.Ck: X-ray scattering
• 68.55.jd: Thickness
• 68.55.ag: Semiconductors
• 81.15.Dj: E-beam and hot filament evaporation deposition
• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)
• 81.15.-z: Methods of deposition of films and coatings; film growth and epitaxy(for structure of thin films, see 68.55.-a; see also 85.40.Sz Deposition technology in microelectronics; for epitaxial dielectric films, see 77.55.Px)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2015
• Volume: 128
• Issue: 3
• Pages: 414-418

Dates

published

2015-09

received

2014-03-19

(unknown)

2015-04-11

(unknown)

2015-08-04

Contributors

author

S. Aly

• Physics Department, Faculty of Science, Minia University, Minia, Egypt

author

Alaa Akl

• Physics Department, Faculty of Science, Minia University, Minia, Egypt
• Faculty of Science in Ad-Dawadmi, Physics Department, Shaqra University, 11911, Kingdom of Saudi Arabia

author

H. Howari

• Deanship of Educational Services, Qassim University, Kingdom of Saudi Arabia
• Physics Department, Faculty of Science, Al-Baath University, Homs, Syria

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Identifiers

DOI

10.12693/APhysPolA.128.414