Thermal Stability Criteria of Se_{80-x}Te_{20}Sb_{x} in Terms of Characteristic Temperatures and Kinetic Parameters

• Authors: E. Shaaban , H. Elshaikh , M. Soraya
• Languages of publication: EN

Abstracts

EN

Thermal stability in terms of characteristic temperature and kinetic parameters of different compositions of glassy Se_{80-x}Te_{20}Sb_{x} (x=0, 2, 4, 6, 8, 10) have been investigated. Differential scanning calorimetry under nonisothermal conditions have been proposed to investigate thermal characteristic of these compositions. The thermal stability of these glasses was obtained in terms of various simple quantitative methods based on the characteristic temperatures, such as the glass transition temperature, T_{g}, the onset temperature of crystallization, T_{in}, the temperature corresponding to the maximum crystallization rate, T_{p}, and the melting temperature, T_{m}. Furthermore, the kinetic parameter K_{r}(T) was achieved as another indicator for thermal stability and its results about stability compared with those evaluated by other criteria. The results of both the criteria and the kinetic parameter K_{r}(T) confirm that the thermal stability increases with increase of Sb content. The results also refer to that: the glass transition T_{g}, activation energy of crystallization E_{p} and the frequency factor K_{0} were increased with the addition of Sb. These results have been discussed in terms of the average coordination number, cohesive energy and average heat of atomization.

Keywords

EN

78.20.-e; 52.40.Db

Discipline

• 52.40.Db: Electromagnetic (nonlaser) radiation interactions with plasma(for electromagnetic wave propagation in the ionosphere and magnetosphere, see 94.20.Bb and 94.30.Tz respectively)
• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2015
• Volume: 128
• Issue: 3
• Pages: 358-366

Dates

published

2015-09

received

2014-06-04

(unknown)

2015-03-29

Contributors

author

E. Shaaban

• Physics Department, Faculty of Science, Al-Azhar University, Assuit, 71542, Egypt

author

H. Elshaikh

• Department of Physics, Faculty of Science, Aswan University, Egypt

author

M. Soraya

• Department of Physics, Faculty of Science, Aswan University, Egypt

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Identifiers

DOI

10.12693/APhysPolA.128.358