Evaluation of Refractive Index Variations of TiO₂:SiO₂:Zr Thin Films by Molar Ratio

• Authors: Z. Bahsi Oral
• Languages of publication: EN

Abstracts

EN

Zr-doped and undoped TiO₂-SiO₂ thin films were fabricated by using sol-gel dip coating. TiO₂:SiO₂:Zr films with different molar ratio were coated on glass substrates. Refractive indexes and the thicknesses of thin films were measured with Metricon 2010 Prism Coupler. The theoretical and measured refractive indexes of thin films were found to be consistently changing with molar ratio. The measured refractive indexes of thin films were lower than the theoretical ones due to the porosity of the structure.

Keywords

EN

81.20.Fw

Discipline

• 81.20.Fw: Sol-gel processing, precipitation(for reactions in sol-gels, see 82.33.Ln; for sol-gels as disperse system, see 82.70.Gg)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2015
• Volume: 127
• Issue: 4
• Pages: 1314-1316

Dates

published

2015-04

Contributors

author

Z. Bahsi Oral

• Gebze Technical University, Department of Environmental Engineering, PK:141 41400 Gebze/Kocaeli, Turkey

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Identifiers

DOI

10.12693/APhysPolA.127.1314