PL EN


Preferences help
enabled [disable] Abstract
Number of results
2015 | 127 | 4 | 937-939
Article title

YIG Film for Magnetic Field Sensor

Content
Title variants
Languages of publication
EN
Abstracts
EN
Single crystal Y₃Fe₅O_{12} (YIG) film was grown onto (111) oriented gadolinium gallium garnet (GGG) substrate by the liquid phase epitaxy (PLD) technique. The X-ray diffraction measurements showed that epitaxial growth of the film along its (111) axis. The surface characteristic was investigated by atomic force microscopy (AFM) measurement. The magnetic field sensor consisted of a rectangular shape with 5 mm wide, 15 mm long and 5 μm thick YIG film and a pair of identical 50 μm wide microstrip copper transducers elements separated by 6 mm. The filter was tested by measuring reflection S_{11} characteristic at various bias magnetic fields. The results have showed that when the bias field increased from 0 to 2.5 kOe, the frequency value corresponding to S_{11} maxima increased from 1 GHz to 9 GHz. This suggests that the wide range magnetic field sensing and the highly sensitive field sensing are simultaneously fulfilled with the YIG film.
Keywords
Contributors
author
  • Inonu University Science and Arts Faculty, Physics Department 44069 Malatya, Turkey
author
  • Inonu University Science and Arts Faculty, Physics Department 44069 Malatya, Turkey
author
  • Inonu University Science and Arts Faculty, Physics Department 44069 Malatya, Turkey
author
  • Inonu University Science and Arts Faculty, Physics Department 44069 Malatya, Turkey
author
  • Inonu University Science and Arts Faculty, Physics Department 44069 Malatya, Turkey
author
  • Inonu University Science and Arts Faculty, Physics Department 44069 Malatya, Turkey
References
  • [1] R.W. Damon, J.R. Eshbach, J. Phys. Chem. Solids 19, 308 (1961), doi: 10.1016/0022-3697(61)90041-5
  • [2] Y.F. Chen, K.T. Wu, T.D. Yao, C.H. Peng, K.L. You, W.S. Tse, Microelectronic Engineering 81, 329 (2005), doi: 10.1016/j.mee.2005.03.028
  • [3] A.A. Serga, A.V. Chumk, B. Hillebrands, J. Phys. D: Appl.Phys. 43, 264002 (2010), doi: 10.1088/0022-3727/43/26/264002
  • [4] O. Kamada, H. Minemoto, S. Ishizuka, J. Appl. Phys. 61, 3268 (1987), doi: 10.1063/1.338877
  • [5] C. Holthaus, I. Nistor, I.D. Mayergoyz, C. Krafft, J. Appl. Phys. 99, 08B308 (2006), doi: 10.1063/1.2169559
  • [6] M. Huang, Z.C. Xu, Thin Solids Films 450, 324 (2004), doi: 10.1016/j.tsf.2003.11.190
  • [7] M. Kucera, J. Bok, K. Nitsch, Solid State Commun. 69, 1117 (1989), doi: 10.1016/0038-1098(89)90497-3
  • [8] N. Kumar, D.S. Misra, N. Venkataramani, S. Prasad, R. Krisnnan, J. Magn. Magn. Mater. 272, E899 (2004), doi: 10.1016/j.jmmm.2003.12.223
  • [9] S. Higuchi, K. Ueda, F. Yahiro, Y. Nakata, H. Uetsuhara, T. Okada, M. Maeda, IEEE Trans. Magn. 37, 2451 (2001), doi: 10.1109/20.951200
  • [10] Y. Sun, Y.Y. Song, M. Wu, Appl. Phys. Lett. 101, 082405 (2012), doi: 10.1063/1.4747465
  • [11] V.F. Shkar, E.I. Nikolaev, V.N. Sayapin, A.I. Linnik, V.P. Denysenkov, A.M. Grishin, S.I. Khartsev, Physics of the solid State 47, 1071 (2005), doi: 10.1134/1.1767247
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv127n4018kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.