Structure and Some Physical Properties of Chemically Deposited Nickel Sulfide Thin Films

• Authors: A. Hammad , Z. ElMandouh , H. Elmeleegi
• Languages of publication: EN

Abstracts

EN

Ni₂S_{2-x} thin films with x=0, 0.5, and 1 were prepared by chemical bath deposition technique. Amorphous structure was discovered by XRD for x=1, while α-Ni₇S₆ and NiS phases were discovered for x=0, and x=0.5 respectively. SEM graphs of the studied films have confirmed the XRD results. Optical band gap values increase from 0.845 to 0.912 eV, with increase of the composition x from 0 to 1. Activation energy values increase in the range from x=0 to x=0.5 and does not change for x=1.

Keywords

EN

61.05.cp; 68.37.Hk; 68.55.jd; 68.55.J-; 78.20.Ci; 78.68.+m; 73.50.Lw; 73.90.+f

Discipline

• 78.68.+m: Optical properties of surfaces
• 73.50.Lw: Thermoelectric effects
• 68.55.jd: Thickness
• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
• 61.05.cp: X-ray diffraction
• 68.37.Hk: Scanning electron microscopy (SEM) (including EBIC)
• 73.90.+f: Other topics in electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures (Restricted to new topics in section 73)
• 68.55.J-: Morphology of films

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2015
• Volume: 127
• Issue: 4
• Pages: 901-903

Dates

published

2015-04

Contributors

author

A. Hammad

• Electron Microscope and Thin Films Department, Physics Division, National Research Centre,, Dokki, 12311, Cairo, Egypt

author

Z. ElMandouh

• Electron Microscope and Thin Films Department, Physics Division, National Research Centre,, Dokki, 12311, Cairo, Egypt

author

H. Elmeleegi

• Electron Microscope and Thin Films Department, Physics Division, National Research Centre,, Dokki, 12311, Cairo, Egypt

References

• [1] R.S. Mane, C.D. Lokhande, Mater. Chem. Phys. 65, 1 (2000), doi: 10.1016/S0254-0584(00)00217-0
• [2] A.M. Salem, M.S. Selim, J. Phys. D. Appl. Phys. 34, 12 (2001), doi: 10.1088/0022-3727/34/1/303
• [3] G. Kullerud, R.A. Yund, J. Petrol. 3, 126 (1962), doi: 10.1093/petrology/3.1.126
• [4] N. Kumar, N. Raman, A. Sundaresan, J. Solid State Chem. 208, 103 (2013), doi: 10.1016/j.jssc.2013.10.010
• [5] K. Ramasamy, M.A. Malik, P. O'Brien, J. Raftery, M. Helliwell, Chem. Mater. 22, 6328 (2010), doi: 10.1021/cm102140t
• [6] H.Seim, H. Fjellvâg, F. Grønvold, S.Stølen, J. Solid State Chem. 121, 400 (1996), doi: 10.1006/jssc.1996.0054
• [7] P. Pramanik, S. Biswas, J. Solid State Chem. 65, 145 (1986), doi: 10.1016/0022-4596(86)90098-8
• [8] S.D. Sartale, C.D. Lokhande, Mater. Chem. Phys. 72, 101 (2001), doi: 10.1016/S0254-0584(01)00314-5
• [9] F. Atay, S.Köse, V.Bılgın, İ. Akyüz, Turk. J. Phys. 27, 285 (2003)
• [10] A.U. Ubale, A.N. Bargal, Mater. Res. Bull. 46, 1000 (2011), doi: 10.1016/j.materresbull.2011.03.016
• [11] A. Sawaby, M.S. Selim, S.Y. Marzouk, M.A. Mostafa, A. Hosny, Physica B 405, 3412 (2010), doi: 10.1016/j.physb.2010.05.015
• [12] R.N. Chauhan, R.S. Anand, J. Kumar, Thin Solid Films 556, 253 (2014), doi: 10.1016/j.tsf.2014.02.023
• [13] A. Hakim, J. Hossain, K.A. Khan, Renewable Energy 34, 2625 (2009), doi: 10.1016/j.renene.2009.05.014

Identifiers

DOI

10.12693/APhysPolA.127.901