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2015 | 127 | 2 | 306-308

Article title

Thermal Fluctuations of Bismuth Based 1G Tape

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EN

Abstracts

EN
The thermal fluctuations of bismuth based commercial 1G tape were studied near the critical temperature T_{c}=110.2 K. The detailed analysis of the temperature dependence of resistivity measurements was made in the temperature region from the zero resistance critical temperature up to 300 K. The thermal fluctuations of conductivity were analysed using the Aslamazov-Larkin microscopic approach and the critical exponents were calculated close to the transition temperature.

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Contributors

author
  • AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, Solid State Physics Department, al. A. Mickiewicza 30, 30-059 Cracow, Poland
author
  • AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, Solid State Physics Department, al. A. Mickiewicza 30, 30-059 Cracow, Poland
author
  • AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, Solid State Physics Department, al. A. Mickiewicza 30, 30-059 Cracow, Poland
  • AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, Solid State Physics Department, al. A. Mickiewicza 30, 30-059 Cracow, Poland

References

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Document Type

Publication order reference

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YADDA identifier

bwmeta1.element.bwnjournal-article-appv127n2045kz
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