EN
The thermal fluctuations of bismuth based commercial 1G tape were studied near the critical temperature T_{c}=110.2 K. The detailed analysis of the temperature dependence of resistivity measurements was made in the temperature region from the zero resistance critical temperature up to 300 K. The thermal fluctuations of conductivity were analysed using the Aslamazov-Larkin microscopic approach and the critical exponents were calculated close to the transition temperature.