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2015 | 127 | 2 | 306-308
Article title

Thermal Fluctuations of Bismuth Based 1G Tape

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EN
Abstracts
EN
The thermal fluctuations of bismuth based commercial 1G tape were studied near the critical temperature T_{c}=110.2 K. The detailed analysis of the temperature dependence of resistivity measurements was made in the temperature region from the zero resistance critical temperature up to 300 K. The thermal fluctuations of conductivity were analysed using the Aslamazov-Larkin microscopic approach and the critical exponents were calculated close to the transition temperature.
Keywords
Year
Volume
127
Issue
2
Pages
306-308
Physical description
Dates
published
2015-02
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv127n2045kz
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