Penetration Depth of Magnetic Field into YBa₂Cu₃Oₓ Film on Polycrystalline Ag Substrate

• Authors: R. Zalecki , W. Woch , M. Chrobak , A. Kołodziejczyk
• Languages of publication: EN

Abstracts

EN

The magnetic field penetration depth into YBa₂Cu₃Oₓ film on polycrystalline Ag substrate with the critical temperature of 90.4 K was determined from the AC susceptibility measurements. The 95 μm thick YBCO film was deposited directly on Ag substrate by the sedimentation process. When the sample is in the Meissner state, the dispersive component of the AC susceptibility as well as its temperature dependence reflects the changes of the penetration depth with the temperature. The penetration depth of this film is found to be 5.4 μm.

Keywords

EN

74.72.-h   74.25.Ha   74.25.Wx   74.20.De  

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2015
• Volume: 127
• Issue: 2
• Pages: 272-274

Dates

published

2015-02

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Identifiers

DOI

10.12693/APhysPolA.127.272