EN
We present a micromagnetic approach to the exchange bias in ferromagnetic/antiferromagnetic thin film systems with a small number of irreversible interfacial magnetic moments. We express the exchange bias field H_{EB} in terms of the fundamental micromagnetic length scale of ferromagnetic - the exchange length l_{ex}. The benefit from this approach is a better separation of the factor related to the ferromagnetic layer from the factor related to the ferromagnetic/antiferromagnetic coupling at interfaces. Using this approach we estimate the upper limit of H_{EB} in real ferromagnetic/antiferromagnetic systems.