Confocal Microscope Studies of MoS_{2} Layer Thickness

• Authors: M. Grzeszczyk , K. Gołasa , B. Piętka , A. Babiński , J. Szczytko
• Languages of publication: EN

Abstracts

EN

We have been studying micro-luminescence of various exfoliated MoS_{2} flakes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way - using atomic force microscopy, electron microscopy or the Raman spectroscopy - requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated flake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical reflectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of MoS_{2} thickness.

Keywords

EN

78.20.Ci; 63.20.dd; 78.30.-j; 78.66.Li

Discipline

• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
• 78.66.Li: Other semiconductors
• 78.30.-j: Infrared and Raman spectra(for vibrational states in crystals and disordered systems, see 63.20.-e and 63.50.-x, respectively; for Raman spectra of superconductors, see 74.25.nd)
• 63.20.dd: Measurements

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 126
• Issue: 5
• Pages: 1207-1208

Dates

published

2014-11

Contributors

author

M. Grzeszczyk

• Nanostructures Engineering, Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Pasteura 5, 02-093 Warszawa, Poland

author

K. Gołasa

• Nanostructures Engineering, Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Pasteura 5, 02-093 Warszawa, Poland

author

B. Piętka

• Nanostructures Engineering, Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Pasteura 5, 02-093 Warszawa, Poland

author

A. Babiński

• Nanostructures Engineering, Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Pasteura 5, 02-093 Warszawa, Poland

author

J. Szczytko

• Nanostructures Engineering, Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Pasteura 5, 02-093 Warszawa, Poland

References

• [1] C.G. Lee, H. Yan, L.E. Brus, T.F. Heinz, J. Hone, S. Ryu, ACS Nano 4, 2695 (2010), doi: 10.1021/nn1003937
• [2] E.S. Kadantsev, P. Hawrylak, Solid State Commun. 152, 909 (2012), doi: 10.1016/j.ssc.2012.02.005
• [3] E. Gourmelon, O. Lignier, H. Hadouda, G. Couturier, J.C. Bernède, J. Tedd, J. Pouzet, J. Salardenne, Sol. Energy Mater. Sol. Cells 46, 115 (1997), doi: 10.1016/S0927-0248(96)00096-7
• [4] W.K. Ho, J.C. Yu, J. Lin, J. Yu, P. Li, Langmuir 20, 5865 (2004), doi: 10.1021/la049838g
• [5] B. Radisavljevic, M.B. Whitwick, A. Kis, ACS Nano 5, 9934 (2011), doi: 10.1021/nn203715c
• [6] B. Radisavljevic, A. Radenovic, J. Brivio, V. Giacometti, A. Kis, Nature Nanotech. 6, 147 (2011), doi: 10.1038/nnano.2010.279
• [7] A. Splendiani, L. Sun, Y. Zhang, T. Li, J. Kim, C.-Y. Chim, G. Galli, F. Wang, Nano Lett. 10, 1271 (2010), doi: 10.1021/nl903868w
• [8] R.F. Frindt, Phys. Rev. 140, A536 (1965), doi: 10.1103/PhysRev.140.A536
• [9] A. Castellanos-Gomez, N. Agraït, G. Rubio-Bollinger, Appl. Phys. Lett. 96, 213116 (2010), doi: 10.1063/1.3442495
• [10] C.V. Ramana, U. Becker, V. Shutthanandan, C.M. Julien, Geochem. Trans. 9, 8 (2008), doi: 10.1186/1467-4866-9-8

Identifiers

DOI

10.12693/APhysPolA.126.1207