Confocal Microscope Studies of MoS_{2} Layer Thickness

• Authors: M. Grzeszczyk , K. Gołasa , B. Piętka , A. Babiński , J. Szczytko
• Languages of publication: EN

Abstracts

EN

We have been studying micro-luminescence of various exfoliated MoS_{2} flakes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way - using atomic force microscopy, electron microscopy or the Raman spectroscopy - requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated flake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical reflectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of MoS_{2} thickness.

Keywords

EN

78.20.Ci   63.20.dd   78.30.-j   78.66.Li  

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 126
• Issue: 5
• Pages: 1207-1208

Dates

published

2014-11

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Identifiers

DOI

10.12693/APhysPolA.126.1207