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2014 | 126 | 5 | 1207-1208
Article title

Confocal Microscope Studies of MoS_{2} Layer Thickness

Content
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Languages of publication
EN
Abstracts
EN
We have been studying micro-luminescence of various exfoliated MoS_{2} flakes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way - using atomic force microscopy, electron microscopy or the Raman spectroscopy - requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated flake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical reflectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of MoS_{2} thickness.
Keywords
Year
Volume
126
Issue
5
Pages
1207-1208
Physical description
Dates
published
2014-11
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv126n544kz
Identifiers
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