Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2014 | 126 | 4a | A-13-A-16

Article title

AC Susceptibility of YBCO 1:2:3 Films on Silver Substrates

Content

Title variants

Languages of publication

EN

Abstracts

EN
The YBa_2Cu_3O_δ films were obtained directly on silver substrates by the sedimentation processes. The thicknesses of these films are of the order of several tens μ. The temperature dependences of the AC susceptibility of the films were measured and analyzed. The critical temperatures of these specimens obtained from the dispersion part of AC susceptibility vary from 89.2 K to 92.5 K. The critical currents were calculated from the absorption part of AC susceptibility using the Bean model. The temperature dependences of the critical currents were fitted using the Ginzburg-Landau strong coupling limit approach.

Keywords

Contributors

author
  • Solid State Physics Department, Faculty of Physics and Applied Computer Science AGH University of Science and Technology, Krakow, Poland
author
  • Solid State Physics Department, Faculty of Physics and Applied Computer Science AGH University of Science and Technology, Krakow, Poland
author
  • Solid State Physics Department, Faculty of Physics and Applied Computer Science AGH University of Science and Technology, Krakow, Poland
  • Solid State Physics Department, Faculty of Physics and Applied Computer Science AGH University of Science and Technology, Krakow, Poland

References

  • [1] X. Wen, D. Qu, B.A. Tent, D. Shi, M. Tomsic, L. Cowey, M. White, IEEE Trans. Applied Supercond. 9, 1506 (1999), doi: 10.1109/77.784679
  • [2] D. Liu, M. Zhou, X. Wang, H. Suo, T. Zuo, M. Schindl, R. Flukiger, Supercond. Sci. Technol. 14, 806 (2001), doi: 10.1088/0953-2048/14/9/334
  • [3] C. Deinhofer, G. Gritzner, Supercond. Sci. Technol. 17, 1196 (2004), doi: 10.1088/0953-2048/17/10/021
  • [4] W.M. Woch, W. Tokarz, R. Zalecki, A. Kołodziejczyk, C. Deinhofer, G. Gritzner, Supercond. Sci. Technol. 23, 025004 (2010), doi: 10.1088/0953-2048/23/2/025004
  • [5] A.P. Malozemoff, IEEE Spectrum 30, 26 (1993), doi: 10.1109/6.272173
  • [6] B. Ullmann, A. Gabler, M. Quilitz, W. Goldacker, IEEE Trans. Appl. Supercond. 7, 2042 (1997), doi: 10.1109/77.620992
  • [7] Y. Ma, K. Watanabe, S. Awaji, M. Motokawa, Physica C 357-360, 337 (2001), doi: 10.1016/S0921-4534(01)00241-6
  • [8] W.M. Woch, J. Chmist, J. Przewoźnik, J. Niewolski, R. Zalecki, A. Kołodziejczyk, Mol. Phys. Rep. 34, 175 (2001)
  • [9] Y. Koike, Y. Yamada, I. Hirabayashi, H. Akata, K. Higashiyama, in: Advances in Superconductivity XI, Eds. N. Koshizuka, S. Tajima, Springer Japan, Tokyo 1999, p. 741, doi: 10.1007/978-4-431-66874-9_171
  • [10] C. Zang, A. Kulpa, A.C.D. Chaklader, Physica C 252, 67 (1995), doi: 10.1016/0921-4534(95)00404-1
  • [11] W.M. Woch, R. Zalecki, A. Kołodziejczyk, H. Sudra, G. Gritzner, Mater. Sci. (Poland) 26, 1091 (2008)
  • [12] C.P. Bean, Phys. Rev. Lett. 8, 250 (1962), doi: 10.1103/PhysRevLett.8.250
  • [13] J.R. Clem, Physica C 153-155, 50 (1988), doi: 10.1016/0921-4534(88)90491-1
  • [14] J.R. Clem, B. Bumble, S.I. Raider, W.J. Gallagher, Y.C. Shih, Phys. Rev. B 35, 6637 (1987), doi: 10.1103/PhysRevB.35.6637
  • [15] K.A. Müller, M. Takashige, J. Bednorz, Phys. Rev. Lett. 58, 1143 (1987), doi: 10.1103/PhysRevLett.58.1143
  • [15a] Y. Yeshurun, A.P. Malozemoff, Phys. Rev. Lett. 60, 2202 (1988), doi: 10.1103/PhysRevLett.60.2202
  • [16] W.M. Woch, R. Zalecki, A. Kołodziejczyk, H. Sudra, G. Gritzner, Supercond. Sci. Technol. 21, 085002 (2008), doi: 10.1088/0953-2048/21/8/085002
  • [17] R. Zalecki, W.M. Woch, M. Chrobak, A. Kołodziejczyk, Acta Phys. Pol. A 121, 850 (2012) http://przyrbwn.icm.edu.pl/APP/PDF/121/a121z4p126.pdf

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv126n4a02kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.