Composition and Microstructure of the Al-Multilayer Graphene Composites Achieved by the Intensive Deformation

• Authors: T. Czeppe , E. Korznikova , P. Ozga , M. Wrobel , L. Litynska-Dobrzynska , G. Korznikova , A. Korznikov , P. Czaja , R. Socha
• Languages of publication: EN

Abstracts

EN

The paper presents results of the studies concerning aluminum-graphene composites produced with use of step technique; first mechanical alloying of Al and graphene powders and later intensive deformation by the high pressure torsion. As a result small, thin and round samples of composites, about 10 mm in diameter were achieved. For comparison similar samples not containing graphene were investigated. The X-ray diffraction, transmission electron microscopy, Raman spectroscopy and X-ray photoelectron spectroscopy were applied to study composites structures and analyze graphene content and atomic bonds. The Raman spectroscopy method suggested multilayer graphene, which could also be identified as the defected nano-graphite as a component of the composite structure as well as some small content of the aluminum carbides. The highly dispersed microstructures of aluminum matrices were identified with the transmission electron microscopy, showing difference between the samples produced with the increased number of rotations, leading to the increased deformation realized. This method revealed carbon and aluminum oxides in large amounts which is interpreted as a surface effect. This method suggested also formation of the carbon-metal and carbon-metal- oxygen atomic bonds, which might partially result from formation of the carbides.

Keywords

EN

81.05.Ni; 81.05.uj; 81.05.ue; 81.05.uf

Discipline

• 81.05.Ni: Dispersion-, fiber-, and platelet-reinforced metal-based composites
• 81.05.uj: Diamond/nanocarbon composites
• 81.05.uf: Graphite
• 81.05.ue: Graphene(for structure of graphene, see 61.48.Gh; for phonons in graphene, see 63.22.Rc; for thermal properties, see 65.80.Ck; for graphene films, see 68.65.Pq; for electronic transport, see 72.80.Vp; for electronic structure, see 73.22.Pr; for optical properties, see 78.67.Wj)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 126
• Issue: 4
• Pages: 921-927

Dates

published

2014-10

Contributors

author

T. Czeppe

• Institute of Metallurgy and Materials Sciences, Polish Academy of Sciences, Kraków, Poland

author

E. Korznikova

• Institute for Metals Superplasticity Problems, Russian Academy of Sciences, Ufa, Russia

author

P. Ozga

• Institute of Metallurgy and Materials Sciences, Polish Academy of Sciences, Kraków, Poland

author

M. Wrobel

• AGH University of Science and Technology, Krakow, Poland

author

L. Litynska-Dobrzynska

• Institute of Metallurgy and Materials Sciences, Polish Academy of Sciences, Kraków, Poland

author

G. Korznikova

• Institute for Metals Superplasticity Problems, Russian Academy of Sciences, Ufa, Russia

author

A. Korznikov

• Institute for Metals Superplasticity Problems, Russian Academy of Sciences, Ufa, Russia

author

P. Czaja

• Institute of Metallurgy and Materials Sciences, Polish Academy of Sciences, Kraków, Poland

author

R. Socha

• Institute of Catalysis and Surfaces Chemistry, Polish Academy of Sciences, Kraków, Poland

References

• [1] K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, Y. Zhang, S.V. Dubonos, I.V. Grigorieva, A.A. Firsov, Science 306, 666 (2004), doi: 10.1126/science.1102896
• [2] A.K. Geim, Science 324, 1530 (2009), doi: 10.1126/science.1158877
• [3] A.K. Geim, K.S. Novoselov, Nature Mater. 6, 183 (2007), doi: 10.1038/nmat1849
• [4] K.S. Novoselov, Z. Jiang, Y. Zhang, S.V. Morozov, H.L. Stormer, U. Zeitler, J.C. Maan, G.S. Boebinger, P. Kim, A.K. Geim, Science 315, 1379 (2007), doi: 10.1126/science.1137201
• [5] C.G. Rocha, M.H. Rümmeli, I. Ibrahim, H. Sevincli, F. Börrnert, J. Kunstmann, A. Bachmatiuk, M. Pötschke, W. Li, S.A.M. Makharza, S. Roche, B. Büchner, G. Cuniberti, in: Graphene, Synthesis and Applications, Eds. W. Choi, J. Lee, CRC Press, Boca Raton 2012, p. 1
• [6] C.G. Lee, X.D. Wei, J.W. Kysar, J. Hone, Science 321, 385 (2008), doi: 10.1126/science.1157996
• [7] D. Lahiri, A. Agarwal, in Ref. [5], p. 188
• [8] C.G. Rocha, F. Ortmann, A. Cresti, B. Biel, D. Jimenez, in Ref. [5], p. 10
• [9] S. Pei, H-M. Cheng, Carbon 50, 3210 (2011), doi: 10.1016/j.carbon.2011.11.010
• [10] T. Otsuji, T. Suemitsu, A. Satou, M. Suemitsu, E. Sano, M. Ryzhii, V. Ryzhii, in Ref. [5], p. 85
• [11] R.Z. Valiev, A.P. Zhilyaev, T.B. Langdon, in: Bulk Nanostructured Materials, TMS Wiley, Hoboken (NJ) 2014, p. 88
• [12] J. Sort, D.C. Ile, A.P. Zhilyaev, A. Concustell, T. Czeppe, M. Stoica, S. Surinach, J. Eckert, M.D. Baró, Scr. Mater. 50, 1221 (2004), doi: 10.1016/j.scriptamat.2004.02.004
• [13] T. Czeppe, G.F. Korznikova, A.W. Korznikov, L. Litynska-Dobrzynska, Z. Światek, Arch. Metall. Mater. 58, 447 (2013), doi: 10.2478/amm-2013-0016
• [14] R.Z. Valiev, A.P. Zhilyaev, T.B. Langdon, in Ref. [11], p. 30
• [15] M.L. Chen, Ch-Y. Park, J-G. Choi, W-Ch. Oh, J. Korean Ceramic Soc. 48, 147 (2011), doi: 10.4191/KCERS.2011.48.2.147
• [16] G. Wang, J. Yang, J. Park, X. Gou, B. Wang, H. Liu, J. Yao, J. Phys. Chem. C 112, 8192 (2008), doi: 10.1021/jp710931h
• [17] Y. Zhou, Z.Q. Li, J. Alloys Comp. 414, 107 (2006), doi: 10.1016/j.jallcom.2005.07.034
• [18] A.C. Ferrari, J.C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K.S. Novoselov, S. Roth, A.K. Geim, Phys. Rev. Lett. 97, 187401 (2006), doi: 10.1103/PhysRevLett.97.187401
• [19] Ado Jorio, Raman Spectroscopy in Graphene Based Systems: Prototypes for Nanoscience and Nanometrology, ISRN Nanotechnology, 2012, doi: 10.5402/2012/234216
• [20] I. Childres, L.A. Jauregui, W. Park, H. Cao, Y.P. Chen, in: New Developments in Photon and Materials Research, Eds. J.I. Jang, Nova Science Pub Inc, Hauppauge (NY) 2013, Ch. 13
• [21] J.F. Moulder, W.F. Stickle, P.E. Sobol, K. Bomben, Handbook of X-ray Photoelectron Spectroscopy, Ed. J. Chastain, 2nd ed., Perkin-Elmer Corporation (Physical Electronics), Waltham (MA) 1992
• [22] Electron Spectroscopy Database; http://lasurface.com
• [23] NIST X-ray Photoelectron Spectroscopy Database; http://srdata.nist.gov/xps/

Identifiers

DOI

10.12693/APhysPolA.126.921