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2014 | 126 | 3 | 849-854
Article title

Effect of Post Growth Annealing on the Structural and Electrical Properties of ZnO/CuO Composite Nanostructures

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In the present work, ZnO/CuO composite nanostructures have been grown on fluorine doped tin oxide coated glass substrate by aqueous chemical growth method. To observe the effect of post growth annealing (500°C, 1 min) on the structural properties of ZnO nanorods scanning electron microscope and X-ray diffraction techniques have been utilized. SEM images of post growth annealed (post growth annealed) sample reveal that the average diameter of ZnO NRs has considerably increased in comparison with as grown sample. Moreover after post growth annealing the ZnO NRs showed more clearly hexagonal wurtzite structure. Beside this the NRs are also uniform and well aligned with a high aspect ratio of ~10. In XRD pattern the strongly intense (002) peak of the post growth annealing sample suggest that the crystal quality of the NRs have also been improved significantly. Since the structural improvement have a significant impact on charge transport properties as well, therefore the effect of post growth annealed has also been investigated by the electrical characterization of ZnO/CuO based heterojunction. The current-voltage measurements of the post growth annealed sample showed improvement in the current in comparison with as grown sample. The impedance study has also confirmed that the post growth annealed has influence on the electrical properties. The presented post growth annealed heterojunction of ZnO/CuO may have space in applications like sensors and oxide based diodes in the devices fabrication.
Physical description
  • [1] S. Ilican, M. Caglar, Y. Caglar, Appl. Surf. Sci. 256, 7204 (2010), doi: 10.1016/j.apsusc.2010.05.052
  • [2] Z.L. Wang, J.H. Song, Science 312, 242 (2006), doi: 10.1126/science.1124005
  • [3] K. Ando, H. Saito, Z.W. Jin, T. Fukumura, M. Kawasaki, Y. Matsumoto, H. Koinuma, J. Appl. Phys. 89, 7284 (2001), doi: 10.1063/1.1356035
  • [4] R. Ghosh, S. Fujihara, D. Basak, J. Electr. Mater. 35, 1728 (2006), doi: 10.1007/s11664-006-0226-6
  • [5] J.Y. Park, D.E. Song, S.S. Kim, Nanotechnology 19, 105503 (2008), doi: 10.1088/0957-4484/19/10/105503
  • [6] M.H. Asif, A. Fulati, O. Nur, M. Willander, C. Brannmark, P. Stralfors, S.I. Borjesson, F. Elinder, Appl. Phys. Lett. 95, 023703 (2009), doi: 10.1063/1.3176441
  • [7] Z.L. Wang,J. Phys.: Cond. Matter. 16, R829 (2004), doi: 10.1088/0953-8984/16/25/R01
  • [8] A. Zainelabdin, S. Zaman, G. Amin, O. Nur, M. Willander, Cryst. Growth. Des. 10, 3250 (2010), doi: 0.1021/cg100390x
  • [9] M.Y. Soomro, I. Hussain, N. Bano, O. Nur, M. Willander, Phys. Status. Solidi R 6, 80 (2012), doi: 10.1002/pssr.201290002
  • [10] A. Khan, M.A. Abbasi, M. Hussain, Z.H. Ibupoto, J. Wissting, O. Nur, M. Willander, Appl. Phys. Lett. 101, 193506 (2012), doi: 10.1063/1.4766921
  • [11] M. Willander, O. Nur, S. Zaman, A. Zainelabdin, N. Bano, I. Hussain, J. Phys. D: Appl. Phys. 44, 224017 (2011), doi: 10.1088/0022-3727/44/22/224017
  • [12] M. Willander, O. Nur, G. Amin, A. Zainelabdin, S. Zaman, MRS Proc. 1406, (2011), doi: 10.1557/opl.2012.65
  • [13] J. Morales, L. Sanchez, F. Martin, J.R. Ramos-Barrado, M. Sanchez, Electrochem. Acta 49, 4589 (2004), doi: 10.1016/j.electacta.2004.05.012
  • [14] S.Y. Gao, S.X. Yang, J. Shu, S.X. Zhang, Z.D. Li, K. Jiang, J. Phys. Chem. C 112, 19324 (2008), doi: 10.1021/jp808545r
  • [15] X.J. Zhang, D.G. Zhang, X.M. Ni, J.M. Song, H.G. Zheng, J. Nanopart. Res. 10, 839 (2008), doi: 10.1007/s11051-007-9320-9
  • [16] Y.W. Zhu, T. Yu, F.C. Cheong, X.J. Xu, C.T. Lim, V.B.C. Tan, J.T.L. Thong, C.H. Sow, Nanotechnology 16, 88 (2005), doi: 10.1088/0957-4484/16/1/018
  • [17] F. Teng, W. Yao, Y. Zheng, Y. Ma, Y. Teng, T. Xu, S. Liang, Y. Zhu, Sens. Act. B: Chem. 134, 761 (2008), doi: 10.1016/j.snb.2008.06.023
  • [18] X.Y. Xue, L.L. Xing, Y.J. Chen, S.L. Shi, Y.G. Wang, T.H. Wang, J. Phys. Chem. C. 112, 12157 (2008), doi: 10.1021/jp8037818
  • [19] J. Morales, L. Sanchez, F. Martin, J.R. Ramos-Barrado, M. Sanchez, Thin Solid Films 474, 133 (2005), doi: 10.1016/j.tsf.2004.08.071
  • [20] X. Fei, Z.Z. Shao, X. Chen, Nanoscale 5, 7991 (2013), doi: 10.1039/c3nr01872e
  • [21] M. Xu, F. Wang, B. Ding, X. Song, J. Fang, RSC Advances 2, 2240 (2012), doi: 10.1039/C2RA01119K
  • [22] D. Li, Y.H. Leung, A.B. Djurisic, Z.T. Liu, M.H. Xie, J. Gao, W.K. Chan, J. Cryst. Growth 282, 105 (2005), doi: 10.1016/j.jcrysgro.2005.04.090
  • [23] A. Zainelabdin, S. Zaman, G. Amin, O. Nur, M. Willander, Appl. Phys. A 108, 921 (2012), doi: 10.1007/s00339-012-6995-2
  • [24] A. Zainelabdin, G. Amin, S. Zaman, O. Nur, J. Lu, L. Hultman, M. Willander, J. Mater. Chem. 22, 11583 (2012), doi: 10.1039/C2JM16597
  • [25] M. Willander, K.ul. Hassan, O. Nur, A. Zainelabdin, S. Zaman, G. Amin, J. Mater. Chem. 22, 2337 (2012), doi: 10.1039/C1JM15152E
  • [26] Y. Zhu, C.H. Sow, T. Yu, Q. Zhao, P. Li, Z. Shen, D. Yu, J.T. Thong, Adv. Funct. Mater. 16, 2415 (2006), doi: 10.1002/adfm.200600251
  • [27] P. Wang, X. Zhao, B. Li, Opt. Expr. 19, 11271 (2011), doi: 10.1364/OE.19.011271
  • [28] S. Jung, S. Jeon, K. Yong, Nanotechnology 22, 015606 (2011), doi: 10.1088/0957-4484/22/1/015606
  • [29] S. Mandal, K. Sambasivarao, A. Dhar, S.K. Ray, AIP 106, 024103 (2009), doi: 10.1063/1.3168489
  • [30] V. Biju, M. Abdul Khaddar, J. Mater. Sci. 36, 5779 (2001), doi: 10.1023/A:1012995703754
  • [31] Y.C. Lee, S.Y. Hu, W. Water, Y. Huang, M. Yang, T. Shen, K. Tiong, C. Huang, Solid State Commun. 143, 250 (2007), doi: 10.1016/j.ssc.2007.05.021
  • [32] T. Yen, D. Strome, S.J. Kim, A.N. Cartwright, W.A. Anderson, J. Electron. Mater. 37, 764 (2008), doi: 10.1007/s11664-007-0357-4
  • [33] D. Fan, R. Zhang, X. Wang, Physica E: Low-dimens. Syst. Nanostr. 42, 2081 (2010), doi: 10.1016/j.physe.2010.03.031
  • [34] S.K. Jaiswal, J. Kumar, J. Alloys Comp. 509, 3859 (2011), doi: 10.1016/j.jallcom.2010.12.125
  • [35] M. Dawber, J.F. Scotta, A.J. Hartmann, J. Eur. Ceram. Soc. 21, 1633 (2001), doi: 10.1016/S0955-2219(01)00081-4
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