Determination of Optical Constants of Nanocluster CdO Thin Films Deposited by Sol-Gel Technique

• Authors: Z. Serbetci , B. Gunduz , A. Al-Ghamdi , F. Al-Hazmic , K. Arık , F. El-Tantawy , F. Yakuphanoglu , W. Farooq
• Languages of publication: EN

Abstracts

EN

The optical properties of the CdO and Pt doped CdO thin films synthesized by sol-gel technique were investigated. The lowest grain size value (81.34 nm) was found to be for CdO thin film. The Pt doped CdO films are transformed to clusters with nanoparticles. The transparency properties of the CdO thin film is changed with Pt doping. The plots of refractive index indicate abnormal and normal dispersion regions. The refractive index values of the CdO thin film are changed with Pt doping. The direct optical band gap values of the films were changed with doping of Pt. The film of 0.5% Pt doped CdO indicates the lowest optical band gap value (2.421 eV). The imaginary parts of the optical conductivity of the CdO and Pt doped CdO thin films are higher than that of the real parts of the optical conductivity.

Keywords

EN

78.67.Bf; 78.20.Ci; 81.20.Fw

Discipline

• 78.67.Bf: Nanocrystals, nanoparticles, and nanoclusters
• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
• 81.20.Fw: Sol-gel processing, precipitation(for reactions in sol-gels, see 82.33.Ln; for sol-gels as disperse system, see 82.70.Gg)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 126
• Issue: 3
• Pages: 798-808

Dates

published

2014-08

received

2014-01-19

(unknown)

2014-07-03

Contributors

author

Z. Serbetci

• Department of Chemistry, Faculty of Arts and Sciences, Bingol University, Bingol, Turkey

author

B. Gunduz

• Department of Science Education, Faculty of Education, Muş Alparslan University, 49100 Muş, Turkey

author

A. Al-Ghamdi

• Department of Physics, Faculty of Science, King Abdulaziz University, Jeddah 21589, Saudi Arabia

author

F. Al-Hazmic

• Department of Physics, Faculty of Science, King Abdulaziz University, Jeddah 21589, Saudi Arabia

author

K. Arık

• Department of Chemistry, Faculty of Arts and Sciences, Bingol University, Bingol, Turkey

author

F. El-Tantawy

• Department of Physics, Faculty of Science, Suez Canal University, Ismailia, Egypt

author

F. Yakuphanoglu

• Department of Physics, Faculty of Science, King Abdulaziz University, Jeddah 21589, Saudi Arabia
• Department of Physics, Faculty of Science, Firat University, Elazig 23169, Turkey

author

W. Farooq

• Department of Physics and Astronomy, College of Science, King Saud University, Riyadh, Saudi Arabia

References

• [1] S. Kose, F. Atay, V. Bilgin, I. Akyuz, Int. J. Hydrogen Energy 34, 5260 (2009), doi: 10.1016/j.ijhydene.2008.11.110
• [2] L. Zhao, J. Lian, Y. Liu, Q. Jiang, Appl. Surf. Sci. 252, 8451 (2006), doi: 10.1016/j.apsusc.2005.11.054
• [3] F.O. Adurodija, L. Semple, R. Bruning, Thin Solid Films 492, 153 (2005), doi: 10.1016/j.tsf.2005.07.114
• [4] I. Saadeddin, B. Pecquenard, J.P. Manaud, R. Decourt, C. Labrugère, T. Buffeteau, Appl. Surf. Sci. 253, 5240 (2007), doi: 10.1016/j.apsusc.2006.11.049
• [5] C.H. Bhosale, A.V. Kambale, A.V. Kokate, K.Y. Rajpure, Mater. Sci. Eng. B 122, 67 (2005), doi: 10.1016/j.mseb.2005.04.015
• [6] B.G. Lewis, D.C. Paine, MRS Bull. 25, 22 (2000), doi: 10.1557/mrs2000.147
• [7] B. Saha, S. Das, K.K. Chattopadhyay, Sol. En. Mater. Solar Cells 91, 1692 (2007), doi: 10.1016/j.solmat.2007.05.025
• [8] K.L. Chopra, S.R. Das, Thin Film Solar Cells, Plenum Press, New York 1983, Ch. 3, p. 346
• [9] G. Phatak, R. Lal, Thin Solid Films 245, 17 (1994), doi: 10.1016/0040-6090(94)90871-0
• [10] A. Verkey, A.F. Fort, Thin Solid Films 239, 211 (1994), doi: 10.1016/0040-6090(94)90853-2
• [11] A.J. Freeman, K.R. Poeppelmeier, T.O. Mason, R.P.H. Chang, T.J. Marks, MRS Bull. 25, 45 (2000), doi: 10.1557/mrs2000.150
• [12] C. Wang, V. Cimalla, G. Cherkashinin, H. Romanus, M. Ali, O. Ambacher, Thin Solid Films 515, 2921 (2007), doi: 10.1016/j.tsf.2006.11.079
• [13] K.L. Chopra, S. Major, D.K. Pandya, Thin Solid Films 102, 1 (1983), doi: 10.1016/0040-6090(83)90256-0
• [14] D.M. Mattox, Thin Solid Films 204, 25 (1991), doi: 10.1016/0040-6090(91)90491-F
• [15] S. Gao, Y. Zhao, P. Gou, N. Chen, Y. Xie, Nanotechnology 14, 538 (2003), doi: 10.1088/0957-4484/14/5/310
• [16] A.N. Banerjee, K.K. Chattopadhyay, J. Appl. Phys. 97, 084308 (2005), doi: 10.1063/1.1866485
• [17] S. Sheng, G. Fang, C. Li, Z. Chen, S. Ma, L. Fang, X. Zhao, Semicond. Sci. Technol. 21, 586 (2006), doi: 10.1088/0268-1242/21/5/002
• [18] Y.X. Huang, Z.G. Ji, C. Chen, Appl. Surf. Sci. 253, 4819 (2007), doi: 10.1016/j.apsusc.2006.10.043
• [19] A.K. Kulkarni, K.H. Schulz, T.S. Lim, B. Khan, Thin Solid Films 345, 273 (1999), doi: 10.1016/S0040-6090(98)01430-8
• [20] N. Ito, Y. Sato, P.K. Song, A. Kaijio, K. Inoue, Y. Shigesato, Thin Solid Films 496, 99 (2006), doi: 10.1016/j.tsf.2005.08.257
• [21] J.T. Lim, C.H. Jeong, A. Vozny, J.H. Lee, M.S. Kim, G.Y. Yeom, Surf. Coat. Technol. 201, 5358 (2007), doi: 10.1016/j.surfcoat.2006.07.036
• [22] H. Kim, C.M. Gilmore, A. Pique, J.S. Horwitz, H. Mattoussi, H. Murata, Z.H. Kafafi, D.B. Chrisey, J. Appl. Phys. 11, 6451 (1999), doi: 10.1063/1.371708
• [23] J.A.A. Selvan, A.E. Delahoy, S. Guo, Y.-M. Li, Sol. En. Mater. Sol. Cells 90, 3371 (2006), doi: 10.1016/j.solmat.2005.09.018
• [24] Z. Zhao, D.L. Morel, C.S. Ferekides, Thin Solid Films 413, 203 (2002), doi: 10.1016/S0040-6090(02)00344-9
• [25] L.M. Su, N. Grote, F. Schmitt, Electron. Lett. 20, 716 (1984), doi: 10.1049/el:19840490
• [26] O. Gomez Daza, A.A.-C. Readigos, J. Campos, M.T.S. Nair, P.K. Nair, Mod. Phys. Lett. B 17, 609 (2001), doi: 10.1142/S0217984901002117
• [27] B.J. Zheng, J.S. Lian, L. Zhao, Q. Jiang, Appl. Surf. Sci. 256, 2910 (2010), doi: 10.1016/j.apsusc.2009.11.049
• [28] F. Yakuphanoglu, M. Caglar, Y. Caglar, S. Ilican, J. Alloys Comp. 506, 188 (2010), doi: 10.1016/j.jallcom.2010.06.174
• [29] C.V. Suryanarayana, Bull. Electrochem. 2, 57 (1986), doi: 10.1016/0254-0584(91)90158-Q
• [30] M.D. Uplane, P.N. Kshirsagar, B.J. Lokhande, C.H. Bhosale, Mater. Chem. Phys. 8630, 1 (1999), doi: 10.1016/j.mseb.2005.04.015
• [31] L.M. Peter, J. Electroanal. Chem. 98, 49 (1979), doi: 10.1016/0013-4686(88)80044-6
• [32] Y. Yang, L. Wang, H. Yan, S. Jin, T.J. Marksa, S. Li, Appl. Phys. Lett. 89, 051116 (2006), doi: 10.1063/1.2240110
• [33] M. Yan, M. Lane, C.R. Kannewurf, R.P.H. Chang, Appl. Phys. Lett. 78, 2342 (2001), doi: 10.1063/1.1365410
• [34] B.J. Zheng, J.S. Lian, L. Zhao, Q. Jiang, Vacuum 85, 861 (2011), doi: 10.1016/j.vacuum.2011.01.002
• [35] T.J. Coutts, D.L. Young, X. Li, W.P. Mulligan, X. Wu, J. Vac. Sci. Technol. A 18, 2646 (2000), doi: 10.1116/1.1290371
• [36] A.W. Metz, J.R. Ireland, J.G. Zheng, R. Lobo, Y. Yang, J. Ni, C.L. Stern, C.V.P. Dravid, N. Bontempz, C.R. Kannewurf, K.R. Poeppelmeier, T.J. Marks, J. Am. Chem. Soc. 126, 8477 (2004), doi: 10.1021/ja039232z
• [37] R. Kumaravel, S. Menaka, S. Regina Mary Snega, K. Ramamurthi, K. Jeganathan, Mater. Chem. Phys. 122, 444 (2010), doi: 10.1016/j.matchemphys.2010.03.022
• [38] J.C. Manifacier, Thin Solid Films 90, 297 (1982), doi: 10.1016/0040-6090(80)90369-7
• [39] B. Saha, R. Thapa, K.K. Chattopadhyay, Solid State Commun. 145, 33 (2008), doi: 10.1016/j.ssc.2007.10.001
• [40] P.H. Jefferson, S.A. Hatfield, T.D. Veal, P.D.C. King, C.F. McConville, J. Zuniga-Perez, V. Munoz-Sanjose, Appl. Phys. Lett. 92, 022101 (2008), doi: 10.1063/1.2896605
• [41] Y.S. Choi, C.G. Lee, S.M. Cho, Thin Solid Films 289, 153 (1996), doi: 10.1016/S0040-6090(96)08923-7
• [42] J.S. Cruz, G.T. Delgado, R.C. Perez, S.J. Sandoval, O.J. Sandoval, C.I.Z. Romero, J.M. Marin, O.Z. Angel, Thin Solid Films 493, 83 (2005), doi: 10.1016/j.tsf.2005.11.041
• [43] R.M. Navarro, F. del Valle, J.L.G. Fierro, Int. J. Hydrog. En. 33, 4265 (2008), doi: 10.1016/j.ijhydene.2008.05.048
• [44] A.A. Dakhel, Semicond. Sci. Technol. 23, 055017 (2008), doi: 10.1088/0268-1242/23/5/055017
• [45] R. Kondo, H. Okhimura, Y. Sakai, Jpn. J. Appl. Phys. 10, 1547 (1971), doi: 10.1023/A:1018564317394
• [46] S. Aksoy, Y. Caglar, S. Ilican, M. Caglar, Int. J. Hydrog. En. 34, 5191 (2009), doi: 10.1016/j.ijhydene.2008.09.057
• [47] M. Ortega, G. Santana, A. Morales-Acevedo, Solid State Electron. 44, 1765 (2000), doi: 10.1016/S0038-1101(00)00123-4
• [48] D.M.C. Galicia, R.C. Perez, O.J. Sandoval, S.J. Sandoval, G.T. Delgado, C.I.Z. Romero, Thin Solid Films 371, 105 (2000), doi: 10.1016/j.snb.2009.04.046
• [49] R.J. Deokate, S.V. Salunkhe, G.L. Agawane, B.S. Pawar, S.M. Pawar, K.Y. Rajpure, A.V. Moholkar, J.H. Kim, J. Alloys Comp. 496, 357 (2010), doi: 10.1016/j.jallcom.2010.01.150
• [50] H. Finnkenrath, H. Kohler, M. Lochmann, Z.F. Angew, PhysicA 21, 512 (1966), doi: 10.1016/0038-1098(86)90920-8
• [51] K. Maschke, U. Rossler, Phys. Status Solidi 28, 577 (1968), doi: 10.1002/pssb.19680280215
• [52] S. Tewari, Solid State Commun. 12, 437 (1973), doi: 10.1016/0022-3697(85)90101-5
• [53] A. Breeze, P.G. Perkins, Solid State Commun. 13, 1031 (1973), doi: 10.1016/0038-1098(73)90424-9
• [54] A.A. Dakhel, Solar Energy 82, 513 (2008), doi: 10.1016/j.solener.2007.12.004
• [55] J. Arthur Nozik, Nano Lett. 10, 2735 (2010), doi: 10.1021/nl102122x
• [56] V. Prashant Kamat, J. Phys. Chem. C 112, 18737 (2008), doi: 10.1021/jp806791s
• [57] C.C. Vidyasagar, Y. Arthoba Naik, T.G. Venkatesh, R. Viswanatha, Powder Technol. 214, 337 (2011), doi: 10.1016/j.powtec.2011.08.025
• [58] M.A. Flores, R. Castanedo, G. Torres, O. Zelaya, Sol. En. Mater. Sol. Cells 93, 28 (2009), doi: 10.1016/j.solmat.2008.02.006
• [59] J.S. Cruz, G.T. Delgado, R.C. Perez, S.J. Sandoval, J.M. Marin, O.Z. Angel, Sol. En. Mater. Sol. Cells 90, 2272 (2006), doi: 10.1016/j.solmat.2006.03.039
• [60] C.S. Ferekides, R. Mamazza, U. Balasubramanian, D.L. Morel, Thin Solid Films 480, 224 (2005), doi: 10.1016/j.tsf.2004.11.094
• [61] C. Xiangfeng, Mater. Res. Bull. 38, 1705 (2003), doi: 10.1016/j.materresbull.2003.07.001
• [62] M. Ristic, S. Popovic, S. Music, Mater. Lett. 58, 2494 (2004), doi: 10.1016/j.matlet.2004.03.016
• [63] T.L. Chu, S.S. Chu, J. Electron. Mater. 19, 1003 (1990), doi: 10.1007/BF02652928
• [64] R.S. Mane, S.H. Han, Electrochem. Commun. 7, 205 (2005), doi: 10.1016/j.elecom.2004.12.010
• [65] F.Z. Wang, Z.Z. Ye, D.W. Ma, L.P. Zhu, F. Zhuge, H.P. He, Appl. Phys. Lett. 87, 1443101 (2005), doi: 10.1063/1.2012521
• [66] F.Z. Wang, H.P. He, Z.Z. Ye, L.P. Zhu, J. Appl. Phys. 8, 084301 (2005), doi: 10.1063/1.2089164
• [67] A. Wang, J.R. Babcock, N.L. Edleman, A.W. Metz, M.A. Lane, R. Asahi, V.P. Dravid, C.R. Kannewurf, Proc. Natl. Acad. Sci. 98, 7113 (2001), doi: 10.1073ypnas.121188298
• [68] B. Li, L. Zeng, F. Zhang, Phys. Status Solidi A 201, 960 (2004), doi: 10.1002/pssa.200306770
• [69] H.M. Ali, H.A. Mohamed, M.M. Wakkad, M.F. Hasaneen, Thin Solid Films 515, 3024 (2007), doi: 10.1016/j.tsf.2006.06.037
• [70] J. Santos Cruz, G. Torres Delgado, R. Castanedo Pérez, C.I. Zúñiga Romero, O. Zelaya Angel, Thin Solid Films 515, 5381 (2007), doi: 10.1016/j.tsf.2007.01.036
• [71] P.K. Ghosh, R. Maity, K.K. Chattopadhyay, Sol. En. Mater. Sol. Cells 81, 279 (2004), doi: 10.1016/j.solmat.2003.11.021
• [72] C. Aydın, H.M. El-Nasser, F. Yakuphanoglu, I.S. Yahia, M. Aksoy, J. Alloys Comp. 509, 854 (2011), doi: 10.1016/j.jallcom.2010.09.111
• [73] B.K. Sonawane, Vrushali Shelke, M.P. Bhole, D.S. Patil, J. Phys. Chem. Solids 72, 1442 (2011), doi: 10.1016/j.jpcs.2011.08.022
• [74] R.K. Gupta, F. Yakuphanoglu, F.M. Amanullah, Physica E 43, 1666 (2011), doi: 10.1016/j.physe.2011.05.019
• [75] Y. Yang, S.J. Shu, J.E. Medvedeva, J.R. Ireland, A.W. Metz, Ni. Jun, M.C. Hersam, A.J. Freeman, T.J. Marks, J. Am. Chem. Soc. 127, 8796 (2005), doi: 10.1021/ja051272a
• [76] A.A. Dakhel, J. Alloys Comp. 475, 51 (2009), doi: 10.1016/j.jallcom.2008.09.095
• [77] R.S. De Biasi, M.L.N. Grillo, J. Alloys Comp. 485, 26 (2009), doi: 10.1016/j.jallcom.2009.06.041
• [78] R. Maity, K.K. Chattopadhyay, Sol. En. Mater. Sol. Cells 90, 597 (2006), doi: 10.1016/j.solmat.2005.05.001
• [79] R.J. Deokate, S.M. Pawar, A.V. Moholkar, V.S. Sawant, C.A. Pawar, C.H. Bhosale, K.Y. Rajpure, Appl. Surf. Sci. 254, 2187 (2008), doi: 10.1016/j.apsusc.2007.09.006
• [80] F. Yakuphanoglu, Solar Energy 85, 2704 (2011), doi: 10.1016/j.solener.2011.08.008
• [81] A.A. Dakhel, J. Mater. Sci. 46, 1455 (2011), doi: 10.1007/s10853-011-5658-6
• [82] A.A. Dakhel, Sol. Energy 83, 934 (2009), doi: 10.1016/j.solener.2008.12.015
• [83] R.K. Gupta, K. Ghosh, R. Patel, P.K. Kahol, Appl. Surf. Sci. 255, 6252 (2009), doi: 10.1016/j.apsusc.2008.07.102
• [84] R.K. Gupta, K. Ghosh, R. Patel, S.R. Mishra, P.K. Kahol, Mater. Lett. 62, 4103 (2008), doi: 10.1016/j.matlet.2008.06.008
• [85] R.K. Gupta, K. Ghosh, R. Patel, S.R. Mishra, P.K. Kahol, Appl. Surf. Sci. 254, 5868 (2008), doi: 10.1016/j.apsusc.2008.08.077
• [86] R.K. Gupta, K. Ghosh, R. Patel, S.R. Mishra, P.K. Kahol, Curr. Appl. Phys. 9, 673 (2009), doi: 10.1016/j.cap.2008.09.007
• [87] E. Martin, M. Yan, M. Lane, J. Ireland, C. Kannewurf, R.H. Chang, Thin Solid Films 461, 309 (2004), doi: 10.1016/j.tsf.2004.01.103
• [88] M. Yan, M. Lane, C.R. Kannewurf, R.P.H. Chang, Appl. Phys. Lett. 78, 02342 (2001), doi: 10.1063/1.1365410
• [89] E. Burstein, Phys. Rev. 93, 632 (1954), doi: 10.1103/PhysRev.93.632
• [90] F. Yakuphanoglu, Appl. Surf. Sci. 257, 1413 (2010), doi: 10.1016/j.apsusc.2010.08.045
• [91] A.A. Dakhel, Thin Solid Films 517, 886 (2008), doi: 10.1016/j.tsf.2008.08.114
• [92] R.J. Deokate, S.V. Salunkhe, G.L. Agawane, B.S. Pawar, S.M. Pawar, K.Y. Rajpure, A.V. Moholkar, J.H. Kim, J. Alloys Comp. 496, 357 (2010), doi: 10.1016/j.jallcom.2010.01.150
• [93] Optical Properties of Solids, Ed. F. Abeles, North-Holland, Amsterdam 1972
• [94] M. DiDomenico, S.H. Wemple, J. Appl. Phys. 40, 720 (1969), doi: 10.1021/ja01038a049
• [95] B. Gunduz, F. Yakuphanoglu, Sensors Actuat. A 178, 141 (2012), doi: 10.1016/j.sna.2012.02.032
• [96] G. Yogeeswaran, C.R. Chenthamarakshan, A. Seshadri, N.R. de Tacconi, K. Rajeshwar, Thin Solid Films 515, 2464 (2006), doi: 10.1016/j.tsf.2006.07.015
• [97] A.K. Wolaton, T.S. Moss, Proc. R. Soc. 81, 5091 (1963), doi: 10.1098/rspb.1963.0075
• [98] W.G. Spitzer, H.Y. Fan, Phys. Rev. 106, 882 (1957), doi: 10.1103/PhysRev.106.882
• [99] J. Taue, in: Optical Properties of Solids, Ed. F. Abeles, North-Holland, Amsterdam 1972
• [100] J.N. Hodgson, Optical Absorption and Dispersion in Solids, Chapman and Hall, London 1970

Identifiers

DOI

10.12693/APhysPolA.126.798