Title variants
Languages of publication
Abstracts
The temperature (T) dependence of roughening as assessed by scanning tunneling microscopy is compared for growth of Ag films on an 5-fold icosahedral Al-Pd-Mn quasicrystal surface and on an ξ'-approximant. Growth on the quasicrystal corresponds to a version of the Volmer-Weber growth, but modified by quantum size effects, and also by kinetic smoothening at low T and low coverages (θ). Growth on the approximant corresponds to a version of the Stranski-Krastanov growth modified by kinetic roughening at low T and low θ. For larger θ, i.e., for thicker films, distinct behavior is observed.
Journal
Year
Volume
Issue
Pages
608-612
Physical description
Dates
published
2014-08
References
- [1] V. Fournée, P.A. Thiel, J. Phys. D, Appl. Phys. 38, R83 (2005), doi: 10.1088/0022-3727/38/6/R01
- [2] V. Fournée, J. Ledieu, M. Shimoda, M. Krajčí, H.-R. Sharma, R. McGrath, Isr. J. Chem. 51, 1314 (2011), doi: 10.1002/ijch.201100141
- [3] B. Ünal, F. Qin, Y. Han, D.J. Liu, D. Jing, A.R. Layson, C. Jenks, J.W. Evans, P.A. Thiel, Phys. Rev. B 76, 195410 (2007), doi: 10.1103/PhysRevB.76.195410
- [4] E. Bauer, Z. Kristallogr. 110, 372 (1958); 110, 395 (1958), doi: 10.1524/zkri.1958.110.1-6.372
- [5] T. Michely, J. Krug, Islands, Mounds, and Atoms: Patterns and Processes in Crystal Growth Far-from-Equilibrium, Springer, Berlin 2004
- [6] J.W. Evans, P.A. Thiel, M.C. Bartelt, Surf. Sci. Rep. 61, 1 (2006), doi: 10.1016/j.surfrep.2005.08.004
- [7] R. Kunkel, B. Poelsema, L.K. Verheij, G. Comsa, Phys. Rev. Lett. 65, 733 (1990), doi: 10.1103/PhysRevLett.65.733
- [8] M.C. Bartelt, J.W. Evans, Surf. Sci. 423, 189 (1999), doi: 10.1016/S0039-6028(98)00906-6
- [9] A.R. Smith, K.-J. Chao, Q. Niu, C.-K. Shih, Science 273, 226 (1996), doi: 10.1126/science.273.5272.226
- [10] Y. Han, B. Unal, D. Jing, P.A. Thiel, J.W. Evans, D.-J. Liu, Materials 3, 3965 (2010), doi: 10.3390/ma3073965
- [11] J.W. Evans, D.E. Sanders, P.A. Thiel, A.E. DePristo, Phys. Rev. B (Rapid Commun.) 41, 5410 (1990), doi: 10.1103/PhysRevB.41.5410
- [12] H.C. Kang, J.W. Evans, Surf. Sci. 269-270, 784 (1992)
- [13] C.R. Stoldt, K.J. Caspersen, M.C. Bartelt, C.J. Jenks, J.W. Evans, P.A. Thiel, Phys. Rev. Lett. 85, 800 (2000), doi: 10.1103/PhysRevLett.85.800
- [14] G. Constantini, F. Buatierde Mongeot, C. Boragno, U. Valbusa, Surf. Sci. 459, L487 (2000)
- [15] K.J. Caspersen, C.R. Stoldt, A.R. Layson, M.C. Bartelt, P.A. Thiel, J.W. Evans, Phys. Rev. B 63, 085401 (2001), doi: 10.1103/PhysRevB.63.085401
- [16] B. Ünal, V. Fournée, P.A. Thiel, J.W. Evans, Phys. Rev. Lett. 102, 196103 (2009), doi: 10.1103/PhysRevLett.102.196103
- [17] V. Fournée, A.R. Ross, T.A. Lograsso, J.W. Evans, P.A. Thiel, Surf. Sci. 537, 5 (2003), doi: 10.1016/S0039-6028(03)00691-5
- [18] I. Horcas, R. Fenández, J.M. Gómez-Rodriguez, J. Colchero, J. Gómez-Herrero, A.M. Baro, Rev. Sci. Instrum. 78, 013705 (2007), doi: 10.1063/1.2432410
- [19] V. Fournée, H.R. Sharma, M. Shimoda, A.P. Tsai, B. Unal, A.R. Ross, T.A. Lograsso, P.A. Thiel, Phys. Rev. Lett. 95, 155504 (2005), doi: 10.1103/PhysRevLett.95.155504
- [20] W.C. Elliott, P.F. Miceli, T. Tse, P.W. Stephens, Phys. Rev. B 54, 17938 (1996), doi: 10.1103/PhysRevB.54.17938
- [21] T. Duguet, B. Unal, Y. Han, J.W. Evans, J. Ledieu, C.J. Jenks, J.M. Dubois, V. Fournee, P.A. Thiel, Phys. Rev. B 82, 224204 (2010), doi: 10.1103/PhysRevB.82.224204
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv126n246kz
Identifiers