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2014 | 126 | 1 | 202-203
Article title

Fano-Kondo Effect of Magnetic Impurity with Side-Coupled Graphene Flake

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EN
Abstracts
EN
We examine transport through a spin-1/2 Kondo impurity, patterned between atomic scale electrodes in the presence of side-coupled nanographene flake. Impurity is attached to the edge of the flake, what allows to test the edge states. The Kotliar Ruckenstein slave boson approach is adopted to describe the strongly correlated impurity. We show that transport measurement of Fano-Kondo effect can serve as a spectroscopic probe of spin resolved graphene flake energy levels. The edge moments can be completely suppressed by gate voltage.
Keywords
Year
Volume
126
Issue
1
Pages
202-203
Physical description
Dates
published
2014-07
References
  • [1] Y.-W. Son, M. L. Cohen, S.G. Louie, Nature 444, 347 (2006), doi: 10.1038/nature05180
  • [2] E. H. Lieb, Phys. Rev. Lett. 62, 1201 (1989), doi: 10.1103/PhysRevLett.62.1201
  • [3] I. Weymann, J. Barnas, S. Krompiewski, Phys. Rev. B 85, 205306 (2012), doi: 10.1103/PhysRevB.85.205306
  • [4] Ch. Tao, L. Jiao, O.V. Yazyev, Y.-C. Chen, J. Feng, X. Zhang, R.B. Capaz, J.M. Tour, A. Zettl, S.G. Louie, H. Dai, M.F. Crommie, Nature Phys. 7, 616 (2011), doi: 10.1038/nphys1991
  • [5] W. Liang, M.P. Shores, M. Bockrath, J.R. Long, H. Park, Nature 417, 725 (2002), doi: 10.1038/nature00790
  • [6] G. Kotliar, A.E. Ruckenstein, Phys. Rev. Lett. 57, 1362 (1986), doi: 10.1103/PhysRevLett.57.1362
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv126n1096kz
Identifiers
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