Fano-Kondo Effect of Magnetic Impurity with Side-Coupled Graphene Flake

• Authors: D. Krychowski , J. Kopiński , S. Lipiński
• Languages of publication: EN

Abstracts

EN

We examine transport through a spin-1/2 Kondo impurity, patterned between atomic scale electrodes in the presence of side-coupled nanographene flake. Impurity is attached to the edge of the flake, what allows to test the edge states. The Kotliar Ruckenstein slave boson approach is adopted to describe the strongly correlated impurity. We show that transport measurement of Fano-Kondo effect can serve as a spectroscopic probe of spin resolved graphene flake energy levels. The edge moments can be completely suppressed by gate voltage.

Keywords

EN

73.22.Pr; 72.80.Vp; 73.23.-b; 72.15.Qm; 85.75.-d

Discipline

• 72.15.Qm: Scattering mechanisms and Kondo effect(see also 75.20.Hr Local moments in compounds and alloys; Kondo effect, valence fluctuations, heavy fermions in magnetic properties and materials)
• 72.80.Vp: Electronic transport in graphene
• 73.22.Pr: Electronic structure of graphene
• 73.23.-b: Electronic transport in mesoscopic systems
• 85.75.-d: Magnetoelectronics; spintronics: devices exploiting spin polarized transport or integrated magnetic fields

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 126
• Issue: 1
• Pages: 202-203

Dates

published

2014-07

Contributors

author

D. Krychowski

• Institute of Molecular Physics, Polish Academy of Sciences M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

J. Kopiński

• Institute of Molecular Physics, Polish Academy of Sciences M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

S. Lipiński

• Institute of Molecular Physics, Polish Academy of Sciences M. Smoluchowskiego 17, 60-179 Poznań, Poland

References

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• [6] G. Kotliar, A.E. Ruckenstein, Phys. Rev. Lett. 57, 1362 (1986), doi: 10.1103/PhysRevLett.57.1362

Identifiers

DOI

10.12693/APhysPolA.126.202