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Abstracts
PbSnS thin films were prepared by hot-wall vacuum evaporation. The Rutherford backscattering technique was employed for the investigation of Pb_{x}Sn_{1 - x}S thin films composition. With a help of atomic force microscopy the main stages in the development of the thin films were characterized. Contact angle measurements of water drop on Pb_{x}Sn_{1 - x}S thin films have been conducted on our original setup.
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Journal
Year
Volume
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Pages
1339-1344
Physical description
Dates
published
2014-06
Contributors
author
- Belarusian State Pedagogical University, Minsk, Belarus
author
- Belarusian State Pedagogical University, Minsk, Belarus
author
- Scientific and Practical Materials Research Centre of the NAS of Belarus, Minsk, Belarus
author
- Lublin University of Technology, Lublin, Poland
References
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- [7] M. Mayer, Nucl. Instrum. Methods Phys. Res. 194, 177 (2002), doi: 10.1016/S0168-583X(02)00689-4
- [8] A. Lopez-Otero, L.D. Haas, Thin Solid Films 23, 1 (1974), doi: 10.1016/0040-6090(74)90211-9
- [9] A. Lafuma, D. Quéré, Nature Mater. 2, 457 (2003), doi: 10.1038/nmat924
- [10] R.E. Johnson, R.H. Dettre, Contact Angle Wettabil., Adhes. Adv. Chem. 43, 112 (1964), doi: 10.1021/ba-1964-0043.ch007
- [11] A.I. Turavets, I.S. Tashlykov, O.G. Bobrovich, in: XXXXII Int. Conf. on Physics of Interaction of Charged Particles with Crystals, Ed.: M.I. Panasiuk, University Book, Moscow 2012, p. 152
Document Type
Publication order reference
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YADDA identifier
bwmeta1.element.bwnjournal-article-appv125n624kz