Elemental Composition, Topography and Wettability of Pb_{x}Sn_{1 - x}S Thin Films

• Authors: I. Tashlykov , A. Turavets , V. Gremenok , P. Żukowski
• Languages of publication: EN

Abstracts

EN

PbSnS thin films were prepared by hot-wall vacuum evaporation. The Rutherford backscattering technique was employed for the investigation of Pb_{x}Sn_{1 - x}S thin films composition. With a help of atomic force microscopy the main stages in the development of the thin films were characterized. Contact angle measurements of water drop on Pb_{x}Sn_{1 - x}S thin films have been conducted on our original setup.

Keywords

EN

68.37.Ps; 06.30.Bp

Discipline

• 06.30.Bp: Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
• 68.37.Ps: Atomic force microscopy (AFM)

• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 125
• Issue: 6
• Pages: 1339-1344

Dates

published

2014-06

Contributors

author

I. Tashlykov

• Belarusian State Pedagogical University, Minsk, Belarus

author

A. Turavets

• Belarusian State Pedagogical University, Minsk, Belarus

author

V. Gremenok

• Scientific and Practical Materials Research Centre of the NAS of Belarus, Minsk, Belarus

author

P. Żukowski

• Lublin University of Technology, Lublin, Poland

References

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Identifiers

DOI

10.12693/APhysPolA.125.1339