X-Ray Photoelectron Spectroscopy - Methodology and Application

• Authors: E. Papis-Polakowska , R. White , C. Deeks , M. Mannsberger , A. Krajewska , W. Strupinski , T. Płocinski , O. Jankowska
• Languages of publication: EN

Abstracts

EN

The crucial measurements aspects of X-ray photoelectron spectroscopy, such as chemical state analysis, depth profiling, mapping, and thickness calculation have been presented. The metal alloys, Ti_2O_5, graphene and type-II InAs/GaSb superlattice structures have been examined by using the new Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer.

Keywords

EN

79.60.-i; 81.05.ue; 68.47.Gh; 68.35.bg; 68.35.bj

Discipline

• 68.47.Gh: Oxide surfaces
• 79.60.-i: Photoemission and photoelectron spectra(for photoelectron spectroscopy, see 87.64.ks in biological physics; 82.80.Pv in chemical analysis)
• 68.35.bg: Semiconductors
• 81.05.ue: Graphene(for structure of graphene, see 61.48.Gh; for phonons in graphene, see 63.22.Rc; for thermal properties, see 65.80.Ck; for graphene films, see 68.65.Pq; for electronic transport, see 72.80.Vp; for electronic structure, see 73.22.Pr; for optical properties, see 78.67.Wj)
• 68.35.bj: Amorphous semiconductors, glasses

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 125
• Issue: 4
• Pages: 1061-1064

Dates

published

2014-04

Contributors

author

E. Papis-Polakowska

• Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland

author

R. White

• Thermo Fisher Scientific, 81 Wyman St., Waltham (MA) 02454 USA

author

C. Deeks

• Thermo Fisher Scientific, 81 Wyman St., Waltham (MA) 02454 USA

author

M. Mannsberger

• Thermo Fisher Scientific, 81 Wyman St., Waltham (MA) 02454 USA

author

A. Krajewska

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland

author

W. Strupinski

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland

author

T. Płocinski

• Warszawa University of Technology, Faculty of Materials Science and Engineering Wołoska 141, 02-507 Warszawa, Poland

author

O. Jankowska

• COMEF, Gdańska 2, 40-719 Katowice, Poland

References

• [1] E. Papis-Polakowska, J. Kaniewski, J. Szade, W. Rzodkiewicz, A. Jasik, K. Reginski, A. Wawro, Thin Solid Films 522, 223 (2012), doi: 10.1016/j.tsf.2012.09.014
• [2] W. Strupinski, K. Grodecki, A. Wysmolek, R. Stepniewski, T. Szkopek, P.E. Gaskell, A. Grüneis, D. Haberer, R. Bozek, J. Krupka, J.M. Baranowski, Nano Lett. 11, 1786 (2011), doi: 10.1021/nl200390e
• [3] D. Ferrah, J. Penuelas, C. Bottela, G. Grenet, A. Ouerghi, Surf. Sci. 615, 47 (2013), doi: 10.1016/j.susc.2013.04.006
• [4] H. Biederman, D. Slavinska, H. Boldyreva, H. Lehmberg, G. Takaoka, J. Matsuo, H. Kinpara, J. Zemek, J. Vac. Sci. Technol. B 19, 2050 (2001), doi: 10.1116/1.1410944

Identifiers

DOI

10.12693/APhysPolA.125.1061