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2014 | 125 | 4 | 1061-1064
Article title

X-Ray Photoelectron Spectroscopy - Methodology and Application

Content
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EN
Abstracts
EN
The crucial measurements aspects of X-ray photoelectron spectroscopy, such as chemical state analysis, depth profiling, mapping, and thickness calculation have been presented. The metal alloys, Ti_2O_5, graphene and type-II InAs/GaSb superlattice structures have been examined by using the new Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer.
Keywords
Contributors
  • Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Thermo Fisher Scientific, 81 Wyman St., Waltham (MA) 02454 USA
author
  • Thermo Fisher Scientific, 81 Wyman St., Waltham (MA) 02454 USA
  • Thermo Fisher Scientific, 81 Wyman St., Waltham (MA) 02454 USA
author
  • Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland
author
  • Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland
author
  • Warszawa University of Technology, Faculty of Materials Science and Engineering Wołoska 141, 02-507 Warszawa, Poland
author
  • COMEF, Gdańska 2, 40-719 Katowice, Poland
References
  • [1] E. Papis-Polakowska, J. Kaniewski, J. Szade, W. Rzodkiewicz, A. Jasik, K. Reginski, A. Wawro, Thin Solid Films 522, 223 (2012), doi: 10.1016/j.tsf.2012.09.014
  • [2] W. Strupinski, K. Grodecki, A. Wysmolek, R. Stepniewski, T. Szkopek, P.E. Gaskell, A. Grüneis, D. Haberer, R. Bozek, J. Krupka, J.M. Baranowski, Nano Lett. 11, 1786 (2011), doi: 10.1021/nl200390e
  • [3] D. Ferrah, J. Penuelas, C. Bottela, G. Grenet, A. Ouerghi, Surf. Sci. 615, 47 (2013), doi: 10.1016/j.susc.2013.04.006
  • [4] H. Biederman, D. Slavinska, H. Boldyreva, H. Lehmberg, G. Takaoka, J. Matsuo, H. Kinpara, J. Zemek, J. Vac. Sci. Technol. B 19, 2050 (2001), doi: 10.1116/1.1410944
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv125n476kz
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