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2014 | 125 | 4 | 1056-1060
Article title

PeakForce Tapping Technique for Characterization of Thin Organic Passivating Layers

Content
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Languages of publication
EN
Abstracts
EN
The PeakForce Tapping technique was used for study of GaAs and GaSb surfaces treated by hexadecanethiol (HDT) - the sensitive self-assemble compound. The results of both surface morphology control and electrical properties characterization have been presented.
Keywords
EN
Contributors
  • Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Labsoft - Krzysztof Herman, Wantule 12, 02-828 Warszawa, Poland
author
  • Bruker Nano Surfaces Division, 112 Robin Hill Road, Santa Barbara, CA 93117, USA
author
  • Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland
References
  • [1] R. García, R. Pérez, Surf. Sci. Rep. 4, 197 (2002), doi: 10.1016/S0167-5729(02)00077-8
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv125n475kz
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