PeakForce Tapping Technique for Characterization of Thin Organic Passivating Layers

• Authors: E. Papis-Polakowska , B. Radkowski , S. Lesko , J. Kaniewski
• Languages of publication: EN

Abstracts

EN

The PeakForce Tapping technique was used for study of GaAs and GaSb surfaces treated by hexadecanethiol (HDT) - the sensitive self-assemble compound. The results of both surface morphology control and electrical properties characterization have been presented.

Keywords

EN

07.79.Lh; 64.75.Yz; 81.65.Rv

Discipline

• 81.65.Rv: Passivation(see also 82.45.Bb Corrosion and passivation in electrochemistry)
• 07.79.Lh: Atomic force microscopes
• 64.75.Yz: Self-assembly

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 125
• Issue: 4
• Pages: 1056-1060

Dates

published

2014-04

Contributors

author

E. Papis-Polakowska

• Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland

author

B. Radkowski

• Labsoft - Krzysztof Herman, Wantule 12, 02-828 Warszawa, Poland

author

S. Lesko

• Bruker Nano Surfaces Division, 112 Robin Hill Road, Santa Barbara, CA 93117, USA

author

J. Kaniewski

• Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland

References

• [1] R. García, R. Pérez, Surf. Sci. Rep. 4, 197 (2002), doi: 10.1016/S0167-5729(02)00077-8

Identifiers

DOI

10.12693/APhysPolA.125.1056