A New Generation of Variable Temperature Scanning Probe Microscope for Spectroscopy

• Authors: P. Chomiuk , B. Uder , A. Bettac , J. Köble , C. Tröppner
• Languages of publication: EN

Abstracts

EN

In this contribution we present the design and first results of a new generation of variable temperature scanning probe microscope that has been developed to enhance the performance in tunnelling spectroscopy at lower temperatures. Its performance has been proven with imaging and spectroscopy experiments on the well known Si(111), Au(111), and Ag(111) surfaces.

Keywords

EN

68.37.Ef; 73.20.At

Discipline

• 73.20.At: Surface states, band structure, electron density of states
• 68.37.Ef: Scanning tunneling microscopy (including chemistry induced with STM)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2014
• Volume: 125
• Issue: 4
• Pages: 1049-1051

Dates

published

2014-04

Contributors

author

P. Chomiuk

• APVACUUM Ltd., Klonowa 24, 62-002 Suchy Las k. Poznania, Poland

author

B. Uder

• Oxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany

author

A. Bettac

• Oxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany

author

J. Köble

• Oxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany

author

C. Tröppner

• Oxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany

References

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Identifiers

DOI

10.12693/APhysPolA.125.1049