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2014 | 125 | 4 | 1049-1051
Article title

A New Generation of Variable Temperature Scanning Probe Microscope for Spectroscopy

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EN
Abstracts
EN
In this contribution we present the design and first results of a new generation of variable temperature scanning probe microscope that has been developed to enhance the performance in tunnelling spectroscopy at lower temperatures. Its performance has been proven with imaging and spectroscopy experiments on the well known Si(111), Au(111), and Ag(111) surfaces.
Keywords
EN
Contributors
author
  • APVACUUM Ltd., Klonowa 24, 62-002 Suchy Las k. Poznania, Poland
author
  • Oxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany
author
  • Oxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany
author
  • Oxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany
author
  • Oxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany
References
  • [1] Omicron VT SPM http://www.omicron.de/en/products/variable-temperature-spm
  • [2] RHK Variable Temp BEETLE http://rhk-tech.com/products/scanning-probe-microscopes/variable-temp-beetle
  • [3] SPM 150 Aarhus, SPM 250 Aarhus EVT http://www.specs.de/cms/front_content.php?idcat=245
  • [4] Omicron LT SPM http://www.omicron.de/en/products/low-temperature-spm/instrument-concept
  • [5] Crea-Tec LT STM http://www.createc.de/uhv-growth-and-analysis/mbe-uhv-systems/lt-stm-afm-systems
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  • [14] R.M. Feenstra, Saw Wai Hla, Chapter from Landolt-Börnstein Review: Scanning Tunneling Microscopy, to be published in Landolt-Börnstein New Series, 2014 http://www.cmu.edu/physics/stm/publ/107/LB-STM.pdf
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv125n473kz
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