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2014 | 125 | 4 | 1038-1041
Article title

Defect Analysis of Pentacene Diode

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EN
Abstracts
EN
This paper demonstrates the analysis of defect states in pentacene film sandwiched between Au and Al electrodes by the deep-level transient spectroscopy method. Three hole-like deep energy levels were observed. The effective mass obtained from the simulation is applied and defect parameters, namely the capture cross-sections and the activation energy 3.7 × 10^{-18} cm^2 at 0.34 eV, 3.1 × 10^{-17} cm^2 at 0.41 eV, and 2.9 × 10^{-15} cm^2 at 0.63 eV is determined from the Arrhenius plot. Reliability of obtained defect parameters is confirmed by simulation of deep level transient spectra and comparison with experiment.
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Contributors
  • Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology Institute of Electronics and Photonics, Ilkovičova 3, 812 19 Bratislava, Slovak Republic
author
  • Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology Institute of Electronics and Photonics, Ilkovičova 3, 812 19 Bratislava, Slovak Republic
author
  • Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology Institute of Electronics and Photonics, Ilkovičova 3, 812 19 Bratislava, Slovak Republic
author
  • Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology Institute of Electronics and Photonics, Ilkovičova 3, 812 19 Bratislava, Slovak Republic
author
  • Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology Institute of Electronics and Photonics, Ilkovičova 3, 812 19 Bratislava, Slovak Republic
author
  • Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology Institute of Electronics and Photonics, Ilkovičova 3, 812 19 Bratislava, Slovak Republic
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv125n471kz
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