Preferences help
enabled [disable] Abstract
Number of results
2014 | 125 | 4 | 902-906
Article title

Scanning X-ray Microscopy with a Single Photon Counting 2D Detector

Title variants
Languages of publication
The experimental application of a novel technique utilizing a high resolution 2D pixel detector (PILATUS) in scanning transmission X-ray microscopy is presented. Measurements were performed at beamline P11 at the PETRA III synchrotron light source. Results are compared to the approach based on a segmented-type detector. A full simulation of the experimental line has been implemented in C++ programming language. Concepts of ptychography and its application in X-ray microscopy are also briefly discussed.
  • AGH University of Science and Technology, Faculty of Physics and Applied Computer Science Al. A. Mickiewicza 30, 30-059 Krakow, Poland
  • DESY Photon Science, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany
  • [1] J. Als-Nielsen, D. McMorrow, Elements of Modern X-ray Physics, 2nd ed., Wiley, Chichester 2011, doi: 10.1002/9781119998365
  • [2] P. Thibault, V. Elser, Annu. Rev. Condens. Matter Phys. 1, 237 (2010), doi: 10.1146/annurev-conmatphys-070909-104034
  • [3] M. Feser, B. Hornberger, C. Jacobsen, G. De Geronimo, P. Rehak, P. Holl, L. Strüder, Nucl. Instrum. Methods Phys. Res. A 565, 841 (2006), doi: 10.1016/j.nima.2006.05.086
  • [4] B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E.F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, B. Schmitt, Nucl. Instrum. Methods Phys. Res. A 607, 247 (2009), doi: 10.1016/j.nima.2009.03.200
  • [5] P. Kraft, A. Bergamaschi, Ch. Broennimann, R. Dinapoli, E.F. Eikenberry, B. Henrich, I. Johnson, A. Mozzanica, C.M. Schlepütz, P.R. Willmott, B. Schmitt, J. Synchrotron Rad. 16, 368 (2009), doi: 10.1107/S0909049509009911
  • [6] R. Brun, F. Rademakers, Nucl. Instrum. Methods Phys. Res. A 389, 81 (1997). See also, doi: 10.1016/S0168-9002(97)00048-X
  • [7] O.K. Ersoy, Diffraction, Fourier Optics and Imaging, Wiley, New Jersey 2007, doi: 10.1002/0470085002
  • [8] M. Frigo, S.G. Johnson, Proc. IEEE 93, 216 (2005), doi: 10.1109/JPROC.2004.840301
  • [9] W. Hoppe, Acta Crystallogr. A 25, 508 (1969)
  • [10] R. Hegerl, W. Hoppe, Ber. Bunsen-Ges. Phys. Chem. 74, 1148 (1970)
  • [11] J.M. Rodenburg, Adv. Imaging Electron Phys. 150, 87 (2008), doi: 10.1016/S1076-5670(07)00003-1
  • [12] M. Dierolf, O. Bunk, S. Kynde, P. Thibault, I. Johnson, A. Menzel, K. Jefimovs, Ch. David, O. Marti, F. Pfeiffer, Europhys. News 39, 22 (2008), doi: 10.1051/epn:2008003
  • [13] A.M. Maiden, J.M. Rodenburg, Ultramicroscopy 109, 1256 (2009), doi: 10.1016/j.ultramic.2009.05.012
Document Type
Publication order reference
YADDA identifier
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.