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2014 | 125 | 3 | 764-766
Article title

Positron Lifetime Measurements of Vacancy Defects in Complex Oxides

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EN
Abstracts
EN
Native defects in complex oxides play a crucial role in determining their optical, electrical, and magnetic properties and it is difficult to identify and characterize them. Positron lifetime spectroscopy is a powerful technique to study vacancy defects; however its application to complex oxides has been limited. In this work we apply positron lifetime spectroscopy to study open volume defects in rare earth doped yttrium aluminum garnet (YAG) complex oxides grown in argon atmosphere. In YAG single crystals, positron lifetime measurements identified isolated aluminum vacancies and complexes of aluminum vacancy and neighbor oxygen vacancies. Thermoluminescence measurements were also performed to elucidate the interaction between trapping defects and luminescence centers. By combining positron lifetime and thermoluminescence, both the defect type and its effect on the optical properties of YAG crystals were revealed.
Keywords
EN
Year
Volume
125
Issue
3
Pages
764-766
Physical description
Dates
published
2014-03
References
  • [1] R. Ramesh, D.G. Schlom, MRS Bull. 33, 1006 (2008)
  • [2] M. Grinberg, A. Sikorska, A. Śliwiński, J. Barzowska, Y.R. Shen, S.B. Ubizskii, S.S. Melnyk, Phys. Rev. B 67, 045113 (2003), doi:10.1103/PhysRevB.67.045113
  • [3] Shin-ichiro M. Nomura, T. Harada, K. Yoshikawa, Phys. Rev. Lett. 88, 093903 (2002), doi:10.1103/PhysRevLett.88.093903
  • [4] Y.N. Xu, Y. Chen, S.D. Mo, W.Y. Ching, Phys. Rev. B 65, 235105 (2002), doi:10.1103/PhysRevB.65.235105
  • [5] A.G. Okhrimchuk, A.V. Shestakov, Phys. Rev. B 61, 988 (2000), doi:10.1103/PhysRevB.61.988
  • [6] E. Zych, C. Brecher, J. Glodo, J. Phys., Condens. Matter 12, 1947 (2000)
  • [7] S.R. Rotman, C. Warde, J. Appl. Phys. 58, 522 (1985), doi:10.1063/1.336291
  • [8] F.A. Selim, D. Solodovnikov, M.H. Weber, K.G. Lynn, Appl. Phys. Lett. 91, 104105 (2007), doi:10.1063/1.2780119
  • [9] R. Krause-Rehberg, H.S. Leipner, Positron Annihilation in Semiconductors, Springer-Verlag, Berlin 1999
  • [10] C.R. Varney, D.T. Mackay, A. Pratt, S.M. Reda, F.A. Selim, J. Appl. Phys. 111, 063505 (2012), doi:10.1063/1.3693581
  • [11] D.T. Mackay, C.R. Varney, J. Buscher, F.A. Selim, J. Appl. Phys. 112, 2 (2012), doi:10.1063/1.4739722
  • [12] D.J. Robbins, B. Cockayne, B. Lent, C.N. Duckworth, J.L. Glasper, Phys. Rev. B 19, 1254 (1979), doi:10.1103/PhysRevB.19.1254
  • [13] V. Babin, K. Blazzek, A. Krasnikov, K. Nejezchleb, M. Nilk, T. Savikhina, S. Zazubovich, Phys. Status Solidi C 2, 97 (2005)
  • [14] C.R. Varney, S.M. Reda, D.T. Mackay, M.C. Rowe, F.A. Selim, AIP Adv. 1, 042170 (2011), doi:10.1063/1.3671646
  • [15] F.A. Selim, C.R. Varney, M.C. Taurn, M.C. Rowe, G.S. Collins, M.D. McClusky, Phys. Rev. B 88, 174102 (2013), doi:10.1103/PhysRevB.88.174102
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv125n322kz
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