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Number of results
2013 | 124 | 5 | 858-861

Article title

X-Ray Photoelectron Spectroscopy Study of Nitrogen and Aluminum-Nitrogen Doped ZnO Films

Content

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EN

Abstracts

EN
Undoped, nitrogen-doped and aluminum-nitrogen co-doped ZnO films were deposited on Si substrates by magnetron sputtering using layer-by-layer method of growth. X-ray photoelectron spectroscopy was employed to characterize electronic properties of undoped and nitrogen doped ZnO films. The effects of N and N-Al incorporation into the ZnO matrix on the X-ray photoelectron spectroscopy core-level and valence-band spectra of the films were studied and discussed.

Keywords

EN

Contributors

  • I. Frantsevich Institute for Problems of Material Science, National Academy of Science of Ukraine, Kyiv, Ukraine
author
  • I. Frantsevich Institute for Problems of Material Science, National Academy of Science of Ukraine, Kyiv, Ukraine
author
  • I. Frantsevich Institute for Problems of Material Science, National Academy of Science of Ukraine, Kyiv, Ukraine
author
  • V. Bakul Institute for Superhard Materials, National Academy of Science of Ukraine, Kyiv, Ukraine
author
  • I. Frantsevich Institute for Problems of Material Science, National Academy of Science of Ukraine, Kyiv, Ukraine
author
  • I. Frantsevich Institute for Problems of Material Science, National Academy of Science of Ukraine, Kyiv, Ukraine

References

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Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv124n531kz
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