PL EN


Preferences help
enabled [disable] Abstract
Number of results
2013 | 124 | 3 | 602-605
Article title

The Sensitivity of Composite Bimodal Waveguide SU-8

Authors
Content
Title variants
Languages of publication
EN
Abstracts
EN
This paper presents the results of measurements of the refractive index and thickness of the waveguide layer SU-8. The mode sensitivity has been calculated as a function of the thickness in a bimodal structure. The differential interference was analyzed concerning modes of the same types TE_0-TE_1 and TM_0-TM_1 and modes of the same order (TE_0-TM_0, TE_1-TM_1). The thickness of the layer was determined when the interferometer is most sensitive to changes of the refractive index. It has been proved that the sensitivity of the structure can be increased by adding a nanometric layer with a high refraction index (n_{A}=1.975) on the waveguide layer.
Keywords
EN
Publisher

Year
Volume
124
Issue
3
Pages
602-605
Physical description
Dates
published
2013-09
Contributors
author
  • Department of Optoelectronics, Silesian University of Technology, Akademicka 2A, 44-100 Gliwice, Poland
References
  • [1] G. Konieczny, T. Pustelny, Acta Phys. Pol. A 122, 962 (2012)
  • [2] K. Barczak, Bull. Pol. Acad. Sci., Techn. Sci. 59, 409 (2011)
  • [3] R. Walczak, P. Sniadek, J.A. Dziuban, Opt. Appl. 41, 873 (2011)
  • [4] A. Sabac, C. Gorecki, M. Jozwik, L. Nieradko, C. Meunier, K. Gut, J. Eur. Op. Soc-Rapid. 2, 07026 (2007)
  • [5] A. Opilski, R. Rogoziński, K. Gut, M. Błahut, Z. Opilski, Opto-Electron. Rev. 8, 117 (2000)
  • [6] P. Struk, T. Pustelny, K. Gołaszewska, E. Kaminska, M. Borysewicz, M. Ekielski, A. Piotrowska, Opto-Electron. Rev. 19, 462 (2011)
  • [7] K. Gut, Bull. Pol. Acad. Sci., Techn. Sci. 59, 395 (2011)
  • [8] H. Guo, P. Zhao, G. Xiao, Z. Zhang, J. Yao, IEEE J. Sel. Top. Quant. Electron. 16, 919 (2010)
  • [9] K. Gut, S. Drewniak, Acta Phys. Pol. A 120, 630 (2011)
  • [10] K. Gut, T. Pustelny, D. Nabaglo, Acta Phys. Pol. A 118, 1136 (2010)
  • [11] K. Gut, D. Nabaglo, Acta Phys. Pol. A 116, 307 (2009)
  • [12] B. Beche, N. Pelletier, E. Gaviot, J. Zyss, Opt. Commun. 230, 91 (2004)
  • [13] K. Gut, Opt. Appl. 42, 407 (2012)
  • [14] R. Urlich, R. Torge, Appl. Opt. 12, 2901 (1973)
  • [15] C. Tyszkiewicz, T. Pustelny, Opt. Appl. 34, 507 (2004)
  • [16] R. Rogozinski, K. Gut, P. Karasinski, Z. Opilski, A. Opilski, Proc. SPIE 3581, 375 (1998)
  • [17] K. Gut, A. Zakrzewski, T. Pustelny, Acta Phys. Pol. A 118, 1140 (2010)
  • [18] K.E. Zinoviev, A.B. González-Guerrero, C. Domínguez, L.M. Lechuga, J. Lightwave Technol. 29, 1926 (2011)
  • [19] K. Gut, P. Karasinski, W.T. Wójcik, R. Rogozinski, Z. Opilski, A. Opilski, Opt. Appl. 29, 101 (1999)
  • [20] B. Pustelny, T. Pustelny, Acta Phys. Pol. A 116, 383 (2009)
  • [21] R. Levy, S. Ruschin, IEEE Sensors J. 9, 146 (2009)
  • [22] K. Gut, Acta Phys. Pol. A 114, 121 (2008)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv124n358kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.