Hyperspectral Imaging Infrared Sensor Used for Enviromental Monitoring

• Authors: M. Kastek , T. Piatkowski , M. Zyczkowski , M. Chamberland , P. Lagueux , V. Farley
• Languages of publication: EN

Abstracts

EN

This paper presents detection, identification and quantification of gases using an infrared imaging Fourier-transform spectrometer. The company Telops has developed an imaging Fourier-transform spectrometer instrument, Hyper-Cam sensor, which is offered as short or long wave infrared sensor. The principle of operation of the spectrometer and the methodology for gases detection, identification and quantification has been shown in the paper, as well as theoretical evaluation of gases detection possibility. The variation of a signal reaching the imaging Fourier-transform spectrometer caused by the presence of a gas has been calculated and compared with the reference signal obtained without the presence of a gas in the imaging Fourier-transform spectrometer field of view. Some result of the detection of various types of gases has been also included in the paper.

Keywords

EN

07.57.Ty; 78.20.Ci; 78.40.-q; 78.47.jg

Discipline

• 07.57.Ty: Infrared spectrometers, auxiliary equipment, and techniques
• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
• 78.47.jg: Time resolved reflection spectroscopy
• 78.40.-q: Absorption and reflection spectra: visible and ultraviolet(for infrared spectra, see 78.30.-j; for optical spectra of superconductors, see 74.25.nd; for time resolved reflection spectroscopy, see 78.47.jg; for multiphoton absorption, see 79.20.Ws in impact phenomena)

• Journal: Acta Physica Polonica A
• Year: 2013
• Volume: 124
• Issue: 3
• Pages: 463-467

Dates

published

2013-09

Contributors

author

M. Kastek

• Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland

author

T. Piatkowski

• Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland

author

M. Zyczkowski

• Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland

author

M. Chamberland

• Telops Inc., Quebec, Canada

author

P. Lagueux

• Telops Inc., Quebec, Canada

author

V. Farley

• Telops Inc., Quebec, Canada

References

• [1] R. Harig, G. Matz, Field Anal. Chem. Technol. 5, 75 (2001)
• [2] R. Harig, G. Matz, P. Rusch, Proc. SPIE 4574, 83 (2002)
• [3] M.K. Griffin, J.P. Kerekes, K.E. Farrar Burke, K.H.-H., Proc. SPIE 4381, 360 (2001)
• [4] T. Burr, N. Hengartner, Sensors 6, 1721 (2006)
• [5] R.L. Lachance, J.-M. Thériault, C. Lafond, A.J. Villemaire, Proc. SPIE 3383, 124 (1998)
• [6] J.-M. Thériault, Technical Report Defence Research Establishment Valcartier (DREV) TR-2000-156 (2001)
• [7] P. Heasler, C. Posse, J. Hylden, K. Anderson, Sensors 7, 905 (2007)
• [8] T.S. Spisz, P.K. Murphy, C.C. Carter, A.K. Carr, A. Vallières, M. Chamberland, Proc. SPIE 6554, 655408 (2007)
• [9] V. Farley, M. Chamberland, P. Lagueux, A. Vallières, A. Villemaire, J. Giroux, Proc. SPIE 6661, 66610L (2007)
• [10] A. Vallières, A. Villemaire, M. Chamberland, L. Belhumeur, V. Farley, J. Giroux, J.-F. Legault, Proc. SPIE 5995, 59950G (2005)
• [11] M. Chamberland, C. Belzile, V. Farley, J.-F. Legault, K. Schwantes, Proc. SPIE 5416, 63 (2004)
• [12] V. Farley, C. Belzile, M. Chamberland, J.-F. Legault, K. Schwantes, Proc. SPIE 5546, 29 (2004)
• [13] M. Kastek, T. Piątkowski, P. Trzaskawka, Metrol. Measur. Syst. 18, 679 (2011)
• [14] P. Tremblay, S. Savary, M. Rolland, A. Villemaire, M. Chamberland, V. Farley, Proc. SPIE 7673, 76730H (2010)
• [15] M. Kastek, T. Piatkowski, R. Dulski, M. Chamberland, P. Lagueux, V. Farley, Phot. Lett. Poland 4, 146 (2012)
• [16] M. Kastek, T. Piatkowski, R. Dulski, M. Chamberland, P. Lagueux, V. Farley, in: Symp. on Photonics and Optoelectronics SOPO 2012, IEEE Photonics Society, Shanghai 2012, art. no. 6270545

Identifiers

DOI

10.12693/APhysPolA.124.463