PL EN


Preferences help
enabled [disable] Abstract
Number of results
2013 | 124 | 3 | 425-427
Article title

Methods of Determining the Beat Length of Planar Waveguides

Authors
Content
Title variants
Languages of publication
EN
Abstracts
EN
The paper presents two methods of determining the planar waveguide birefringence and the measuring stands, which are used to determine the beat length of planar waveguide structures. The light is introduced into the waveguide through a prism coupler. The first method applies measurements of scattered light. The second method uses an immersion coupler. The most fundamental property of an immersion coupler is the possibility to change fluently the propagation length while immersing the waveguide.
Keywords
EN
Publisher

Year
Volume
124
Issue
3
Pages
425-427
Physical description
Dates
published
2013-09
Contributors
author
  • Department of Optoelectronics, Silesian University of Technology, Akademicka 2A, 44-100 Gliwice, Poland
References
  • [1] G. Konieczny, T. Pustelny, Acta Phys. Pol. A 122, 962 (2012)
  • [2] T. Pustelny, C. Tyszkiewicz, K. Barczak, Opt. Appl. 33, 469 (2003)
  • [3] K. Barczak, Bull. Pol. Acad. Sci., Techn. Sci. 59, 409 (2011)
  • [4] T. Pustelny, J. Ignac-Nowicka, Z. Opilski, Opt. Appl. 34, 563 (2004)
  • [5] K. Barczak, T. Pustelny, D. Dorosz, J. Dorosz, Europ. Phys. J. ST 154, 11 (2008)
  • [6] T. Pustelny, M. Procek, E. Maciak, A. Stolarczyk, S. Drewniak, M. Urbańczyk, M. Setkiewicz, K. Gut, Z. Opilski, Bull. Pol. Acad. Sci., Tech. Sci. 60, 853 (2012)
  • [7] B. Beche, N. Pelletier, E. Gaviot, J. Zyss, Opt. Commun. 230, 91 (2004)
  • [8] R. Rogozinski, K. Gut, P. Karasiński, Z. Opilski, A. Opilski, Proc. SPIE 3581, 375 (1998)
  • [9] K. Gut, A. Zakrzewski, T. Pustelny, Acta Phys. Pol. A 118, 1140 (2010)
  • [10] K. Gut, Proc. SPIE 5956, 59561N-1 (2005)
  • [11] M. Szczurowski, W. Urbanczyk, M. Napiorkowski, P. Hlubina, U. Hollenbach, H. Sieber, J. Mohr, Appl. Opt. 50, 2594 (2011)
  • [12] A. Opilski, R. Rogoziński, K. Gut, M. Błahut, Z. Opilski, Opto-Electron. Rev. 8, 117 (2000)
  • [13] K. Gut, Acta Phys. Pol. A 114, A121 (2008)
  • [14] K. Gut, S. Drewniak, Acta Phys. Pol. A 118, 1133 (2010)
  • [15] K. Gut, T. Pustelny, D. Nabaglo, Acta Phys. Pol. A 118, 1136 (2010)
  • [16] K. Gut, P. Karasiński, W.T. Wójcik, R. Rogoziński, Z. Opilski, A. Opilski, Opt. Appl. 29, 101 (1999)
  • [17] K. Gut, S. Drewniak, Acta Phys. Pol. A 120, 630 (2011)
  • [18] K. Gut, Bull. Pol. Acad. Sci., Techn. Sci. 59, 395 (2011)
  • [19] S.Y. Cheng, K.S. Chiang, H.P Chan, Phot. Tech. Lett. 15, 700 (2003)
  • [20] Z.B. Ren, Ph. Robert, P.A. Paratte, J. Phys. E, Sci. Instrum. 18, 859 (1985)
  • [21] G. Golojuch, U. Hollenbach, T. Mappes, J. Mohr, A. Urbanczyk, W. Urbanczyk, Meas. Sci. Technol. 19, 025304 (2008)
  • [22] W.W. Hu, K. Inagaki, Y. Mizuguchi, Opt. Lett. 26, 193 (2001)
  • [23] K. Gut, Acta Phys. Pol. A 122, 818 (2012)
  • [24] K. Gut, K. Nowak, Eur. Phys. J. ST 154, 89 (2008)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv124n313kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.