Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2013 | 124 | 1 | 41-45

Article title

Investigation on Zinc Selenide and Copper Selenide Thin Films Produced by Chemical Bath Deposition

Content

Title variants

Languages of publication

EN

Abstracts

EN
The zinc selenide and copper selenide thin films were deposited by chemical deposition technique on glass substrates. For both films, sodium selenosulphate was used as a selenide ion source in an alkaline solution. The X-ray diffraction patterns show that the ZnSe has a cubic structure and Cu_3Se_2 film has a tetragonal structure. The relative intensity K_ β / K_ α of zinc and copper selenide thin films has been measured by using a ^{241}Am radioisotope source (75 mCi). The obtained results were compared with the theoretical values.

Keywords

Contributors

author
  • Kilis 7 Aralik University, Vacational Higher School of Health Services, Opticianry Program, 79000, Kilis, Turkey
author
  • Kahramanmaras Sütcü Imam University, Faculty of Science and Letters, Department of Physics, 46100, K. Maraş, Turkey
  • International University of Sarajevo, Department of Electrical and Electronics Engineering, 71210, Sarajevo, Bosnia and Herzegovina
author
  • Kahramanmaras Sütcü Imam University, Faculty of Science and Letters, Department of Physics, 46100, K. Maraş, Turkey
author
  • Kahramanmaras Sütcü Imam University, Faculty of Science and Letters, Department of Physics, 46100, K. Maraş, Turkey
author
  • Kahramanmaras Sütcü Imam University, Faculty of Science and Letters, Department of Physics, 46100, K. Maraş, Turkey

References

  • [1] R.J. Robinson, Z.K. Kun, Appl. Phys. Lett. 27, 74 (1975)
  • [2] S. Fujita, H. Mimoto, T. Noguchi, J. Appl. Phys. 50, 1079 (1979)
  • [3] G.F. Neumark, R.M. Mark, J. Depuyat, Phys. Today 47, 26 (1994)
  • [4] S.K. Haram, K.S.V. Santhanam, M. Numannspallart, C. Levyclement, Mater. Res. Soc. Bull. 27, 1185 (1992)
  • [5] V.M. Gracia, P.K. Nair, M.T.S. Nair, J. Cryst. Growth 203, 113 (1999)
  • [6] M. Lakshmi, K. Bindu, S. Bini, K.P. Vijayakumar, C.S. Kartha, T. Abe, Y. Kashiwaba, Thin Solid Films 386, 127 (2001)
  • [7] H. Okimura, T. Matsumae, R. Makabe, Thin Solid Films 71, 53 (1980)
  • [8] W.S. Chen, J.M. Stewart, R.A. Mickelsen, Appl. Phys. Lett. 46, 1095 (1985)
  • [9] G.K. Padam, Thin Solid Films 150, 89 (1987)
  • [10] A.M. Hermann, L. Fabick, J. Cryst. Growth. 61, 658 (1983)
  • [11] D. Lippkow, H.H. Strehblow, Electrochem. Acta 43, 2131 (1998)
  • [12] C. Kaito, A. Nonaka, S. Kimura, N. Suzuki, Y. Saito, J. Cryst. Growth 186, 386 (1998)
  • [13] R.N. O'Brien, K.S.V. Santhanam, J. Electrochem. Soc. 139, 434 (1992)
  • [14] S. Massaccesi, S. Sanchez, J. Vedel, J. Electrochem. Soc. 140, 2540 (1993)
  • [15] K. Yamamoto, S. Kashida, J. Solid State Chem. 93, 202 (1991)
  • [16] M. Dhanam, P.K. Manoj, R.R. Prabhu, J. Cryst. Growth 280, 425 (2005)
  • [17] M. Lakshmi, K. Bindhu, S. Bini, K.P. Vijayakumar, C.S. Kartha, T. Abe, Y. Kashiwaba, Thin Solid Films 370, 89 (2000)
  • [18] P.K. Nair, M.T.S. Nair, V.M. Gracia, O.L. Arenas, Y. Pena, A. Castillo, I.T. Ayala, O. Gomezdaza, A. Sanchez, J. Campos, H. Hu, R. Suarez, M.E. Rincon, Sol. Energ. Mater. Sol. Cells. 52, 313 (1998)
  • [19] C.D. Lokhande, P.S. Patil, A. Ennaoui, H. Tributsch, Appl. Surf. Sci. 123, 294 (1998)
  • [20] A.M. Chaparro, C. Maffiotte, M.T. Gutiérrez, J. Herrero, Thin Solid Films 358, 22 (2000)
  • [21] J.M. Dona, J. Herrero, J. Electrochem. Soc. 142, 764 (1995)
  • [22] R.B. Kale, C.D. Lokhande, Appl. Surf. Sci. 252, 929 (2005)
  • [23] B. Pejova, I. Grozdanov, Solid State Chem. 158, 49 (2001)
  • [24] R.E. van Grieken, A.A. Markowicz, Hand Book of X-ray Spectrometry, Marcel Dekker, New York 1993
  • [25] V. Aylıkcı, E. Tıraşoğlu, G. Apaydın, N. Kaya, E. Cengiz, Phys. Scr. 76, 31 (2007)
  • [26] S. Raj, H.C. Padhi, M. Polasik, Nucl. Instrum. Methods Phys. Res. B 160, 443 (2000)
  • [27] S. Raj, H.C. Padhi, M. Polasik, Nucl. Instrum. Methods Phys. Res. B 155, 143 (1999)
  • [28] F. Pawlowski, M. Polasik, S. Raj, H.C. Padhi, D.K. Basa, Nucl. Instrum. Methods Phys. Res. B 195, 367 (2002)
  • [29] Ö. Söğüt, E. Baydas, S. Seven, E. Büyükkasap, A. Kucukonder, Spectrochim. Acta B 56, 1367 (2001)
  • [30] Ö. Söğüt, S. Çolak, E. Büyükkasap, A. Kucukonder, J. Radioanal. Nucl. Chem. 251, 135 (2002)
  • [31] Ö. Söğüt, E. Büyükkasap, H. Erdoğan, Radiat. Phys. Chem. 64, 343 (2002)
  • [32] A. Kucukonder, Ö. Söğüt, E. Büyükkasap, E. Kucukonder, H. Çam, X-ray Spectrom. 32, 60 (2003)
  • [33] A. Kucukonder, Ö. Söğüt, F. Sumbul, E. Büyükkasap, J. Radioanal. Nucl. Chem. 270, 695 (2006)
  • [34] E. Tıraşoğlu, Ö. Söğüt, A. Tekbıyık, G. Apaydın, B. Ertuğral, J. Quant. Spectrosc. Radiat. Transfer 103, 275 (2007)
  • [35] U. Çevik, I. Değirmenci, B. Ertuğrul, G. Apaydın, H. Balta, Eur. Phys. J. D 36, 29 (2005)
  • [36] Ö. Söğüt, E. Büyükkasap, A. Kucukonder, M. Ertuğrul, Ö. Şimşek, Appl. Spectrosc. Rev. 30, 175 (1995)
  • [37] Ö. Söğüt, Phys. Scr. 73, 466 (2006)
  • [38] E. Bacaksız, U. Çevik, Chem. Phys. Lett. 437, 132 (2006)
  • [39] A. Kucukonder, Eur. Phys. J. D 17, 293 (2001)
  • [40] J.H. Scofıeld, Theoretical Photoionization Cross Section from 1 keV to 1500 keV, Lawrence Livermore Laboratory, UCRL 51326 Livermore, California 1973
  • [41] J.H. Hubbell, P.N. Trehan, N. Sing, B. Chand, D. Mehta, M.L. Garg, R.R. Garg, S. Singh, S. Puri, J. Phys. Chem. Ref. Data 23, 339 (1994)
  • [42] J.H. Scofıeld, At. Data Nucl. Data Tables 14, 121 (1974)
  • [43] L. Gerward, N. Guilbert, K.B. Jensen, H. Levring, Radial. Phys. Chem. 71, 653 (2004)
  • [44] M. Ertuğrul, Ö. Söğüt, Ö. Şimşek, E. Büyükkasap, J. Phys. B At. Mol. Opt. Phys. 34, 909 (2001)
  • [45] J.S. Hansen, H.U. Freund, R.W. Fink, Nucl. Phys. A 142, 604 (1970)
  • [46] M.R. Khan, M. Karimi, X-ray Spectrom. 9, 32 (1980)

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv124n108kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.