Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2013 | 123 | 5 | 828-830

Article title

Analysis of Crystal Lattice Deformation by Ion Channeling

Content

Title variants

Languages of publication

EN

Abstracts

EN
A model of dislocations has been developed for the use in Monte Carlo simulations of ion channeling spectra obtained for defected crystals. High resolution transmission electron microscopy micrographs show that the dominant type of defects in the majority of ion irradiated crystals are dislocations. The RBS/channeling spectrum is then composed of two components: one is due to direct scattering on randomly displaced atoms and the second one is related to beam defocussing on dislocations, which produce predominantly crystal lattice distortions, i.e. bent channels. In order to provide a correct analysis of backscattering spectra for the crystals containing dislocations we have modified the existing Monte Carlo simulation code "McChasy". A new version of the code has been developed by implementing dislocations on the basis of the Peierls-Nabarro model. Parameters of the model have been determined from the high resolution transmission electron microscopy data. The newly developed method has been used to study the Ar-ion bombarded SrTiO_3 samples. The best fit to the Rutherford backscattering/channeling spectra has been obtained by optimizing the linear combination of two kinds of defects: displaced atoms and bent channels. The great virtue of the Monte Carlo simulation is that unlike a traditional dechanneling analysis it allows quantitative analysis of crystals containing a mixture of different types of defects.

Keywords

Contributors

author
  • National Centre for Nuclear Research, A. Sołtana 7, 05-400 Otwock/Świerk, Poland
  • Institute for Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland
author
  • National Centre for Nuclear Research, A. Sołtana 7, 05-400 Otwock/Świerk, Poland
  • Institute for Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland
author
  • National Centre for Nuclear Research, A. Sołtana 7, 05-400 Otwock/Świerk, Poland
author
  • National Centre for Nuclear Research, A. Sołtana 7, 05-400 Otwock/Świerk, Poland
  • Institute for Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland
author
  • National Centre for Nuclear Research, A. Sołtana 7, 05-400 Otwock/Świerk, Poland
  • Institute for Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland
author
  • Pacific Northwest National Laboratory, Richland, WA 99352, USA
author
  • Pacific Northwest National Laboratory, Richland, WA 99352, USA
  • Pacific Northwest National Laboratory, Richland, WA 99352, USA
author
  • Pacific Northwest National Laboratory, Richland, WA 99352, USA
author
  • Institute of Physics, PAS, al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, PAS, al. Lotników 32/46, 02-668 Warszawa, Poland

References

  • 1. W. Jiang, M.E. Bowden, Z. Zhu, P. Jóźwik, J. Jagielski, A. Stonert, Ind. Eng. Chem. Res. 51, 621 (2012)
  • 2. E. Bøgh, Can. J. Phys. 46, 653 (1968)
  • 3. J.H. Barret, Phys. Rev. B 3, 1527 (1971)
  • 4. A. Dygo, A. Turos, Phys. Rev. B 40, 7704 (1989)
  • 5. L. Nowicki, A. Turos, R. Ratajczak, A. Stonert, F. Garrido, Nucl Instrum. Methods Phys. Res. B 240, 277 (2005)
  • 6. R. Peierls, Proc. Phys. Soc. 52, 34 (1940)
  • 7. F.R.N. Nabarro, Proc. Phys. Soc. 59, 256 (1947)
  • 8. A. Turos, L. Nowicki, A. Stonert, K. Pagowska, J. Jagielski, A. Muecklich, Nucl. Instrum. Methods Phys. Res. B 268, 1718 (2010)
  • 9. J. Jagielski, L. Thomé, Y. Zhang, C.M. Wang, A. Turos, L. Nowicki, K. Pagowska, I. Jozwik, Nucl. Instrum. Methods Phys. Res. B 268, 2056 (2010)

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv123n510kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.