Sputtering of Benzene Sample by Large Ne, Ar and Kr Clusters - Molecular Dynamics Computer Simulations

• Authors: L. Rzeznik , R. Paruch , B. Garrison , Z. Postawa
• Languages of publication: EN

Abstracts

EN

Molecular dynamics simulations are employed to probe the role of an impact angle on emission efficiency of organic molecules sputtered from benzene crystal bombarded by 15 keV Ne_{2953}, Ar_{2953}, and Kr_{2953} clusters. It is found that both the cluster type and the angle of incidence have significant effect on the emission efficiency. The shape of the impact angle dependence does not resemble the dependence characteristic for medium size clusters (C_{60}, Ar_{366}), where sputtering yield only moderately increases with the impact angle, has a shallow maximum around 40° and then decreases. On the contrary, for the large projectiles (Ne_{2953}, Ar_{2953}, and Kr_{2953}) the emission efficiency steeply increases with the impact angle, has a pronounced maximum around 55° followed by rapid signal decay. It has been found that the sputtering yield is the most sensitive to the impact angle change for Kr cluster projectiles, while change of the impact angle of Ne projectile has the smallest effect on the efficiency of material ejection.

Keywords

EN

68.49.Sf; 82.80.Ms; 83.10.Rs; 61.82.Pv; 79.20.Rf

Discipline

• 82.80.Ms: Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
• 79.20.Rf: Atomic, molecular, and ion beam impact and interactions with surfaces(for atomic and molecular beam techniques, see 37.20.+j; see also 34.35.+a Interactions of atoms and molecules with surfaces)
• 83.10.Rs: Computer simulation of molecular and particle dynamics
• 61.82.Pv: Polymers, organic compounds
• 68.49.Sf: Ion scattering from surfaces (charge transfer, sputtering, SIMS)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2013
• Volume: 123
• Issue: 5
• Pages: 825-827

Dates

published

2013-05

Contributors

author

L. Rzeznik

• University of Information Technology and Management, Rzeszów, Poland

author

R. Paruch

• Institute of Physics, Jagiellonian University, Kraków, Poland

author

B. Garrison

• Department of Chemistry, The Pennsylvania State University, PA 16802, USA

author

Z. Postawa

• Institute of Physics, Jagiellonian University, Kraków, Poland

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Identifiers

DOI

10.12693/APhysPolA.123.825