XPS and Raman Characterizations of Zn_{1-x}Cd_{x}O Films Grown at the Different Growth Conditions

• Authors: I. Shtepliuk , O. Khyzhun , G. Lashkarev , V. Khomyak , V. Lazorenko
• Languages of publication: EN

Abstracts

EN

X-ray photoelectron spectroscopy was employed to characterize the surface chemistry and electronic properties of the Zn_{1-x}Cd_{x}O semiconductor systems obtained at the different growth conditions. The effect of the growth conditions on the core and valence band spectra as well as room-temperature photoluminescence of the Zn_{1-x}Cd_{x}O films was investigated and discussed. Behavior of the X-ray photoelectron spectroscopy peaks indicated an increase of the cadmium and a depletion of the oxygen concentrations upon changing the Ar/O_2 gas ratio and dc power.

Keywords

EN

78.55.Et; 78.67.Bf

Discipline

• 78.67.Bf: Nanocrystals, nanoparticles, and nanoclusters
• 78.55.Et: II-VI semiconductors

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2012
• Volume: 122
• Issue: 6
• Pages: 1034-1038

Dates

published

2012-12

Contributors

author

I. Shtepliuk

• I. Frantsevich Institute for Problems of Material Science, NASU, 03680, Kiev, Ukraine

author

O. Khyzhun

• I. Frantsevich Institute for Problems of Material Science, NASU, 03680, Kiev, Ukraine

author

G. Lashkarev

• I. Frantsevich Institute for Problems of Material Science, NASU, 03680, Kiev, Ukraine

author

V. Khomyak

• Chernivtsi National University, 58012, Chernivtsi, Ukraine

author

V. Lazorenko

• I. Frantsevich Institute for Problems of Material Science, NASU, 03680, Kiev, Ukraine

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Identifiers

DOI

10.12693/APhysPolA.122.1034