Complex THz Reflectance Spectra of Hexogen Measured for Various Surfaces

• Authors: N. Palka
• Languages of publication: EN

Abstracts

EN

In this paper, we report on measurements of reflection spectra of hexogen (RDX) by means of time domain spectroscopy. We analyzed both phase and amplitude of reflected impulses for three cases: detuning, samples with rough surfaces and samples with curved surfaces. It can be concluded that both spectral characteristics can be applied for identification of explosives in the reflection configuration.

Keywords

EN

07.57.Ty; 78.20.Ci; 78.40.Pg; 78.40.-q; 78.47.jg

Discipline

• 07.57.Ty: Infrared spectrometers, auxiliary equipment, and techniques
• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
• 78.47.jg: Time resolved reflection spectroscopy
• 78.40.-q: Absorption and reflection spectra: visible and ultraviolet(for infrared spectra, see 78.30.-j; for optical spectra of superconductors, see 74.25.nd; for time resolved reflection spectroscopy, see 78.47.jg; for multiphoton absorption, see 79.20.Ws in impact phenomena)
• 78.40.Pg: Disordered solids

• Journal: Acta Physica Polonica A
• Year: 2012
• Volume: 122
• Issue: 5
• Pages: 854-857

Dates

published

2012-11

Contributors

author

N. Palka

• Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland

References

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Identifiers

DOI

10.12693/APhysPolA.122.854