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2012 | 122 | 5 | 854-857
Article title

Complex THz Reflectance Spectra of Hexogen Measured for Various Surfaces

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Abstracts
EN
In this paper, we report on measurements of reflection spectra of hexogen (RDX) by means of time domain spectroscopy. We analyzed both phase and amplitude of reflected impulses for three cases: detuning, samples with rough surfaces and samples with curved surfaces. It can be concluded that both spectral characteristics can be applied for identification of explosives in the reflection configuration.
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author
  • Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland
References
  • [1] L. Yun-Shik, Principles of Terahertz Science and Technology, Springer, New York 2008, p. 59
  • [2] M.C. Kemp, IEEE Trans. Terahertz Sci. Technol. 1, 282 (2011)
  • [3] T. Pustelny, J. Ignac-Nowicka, Z. Opilski, Opt. Appl. 34, 563 (2004)
  • [4] J. Chen, Y. Chen, H. Zhao, G.J. Bastiaans, X.-C. Zhang, Opt. Expr. 15, 12060 (2007)
  • [5] M.R. Leahy-Hoppa, M.J. Fitch, X. Zheng, L.M. Hayden, R. Osiander, Chem. Phys. Lett. 434, 227 (2007)
  • [6] N. Palka, Acta Phys. Pol. A 120, 713 (2011)
  • [7] Teraview Ltd., Presentations and manuals, www.teraview.com (2011)
  • [8] N. Palka, Acta Phys. Pol. A 118, 1228 (2010)
  • [9] X.-C. Zhang, J. Xu, Introduction to THz Wave Photonics, Springer, New York 2010, p. 204
  • [10] T. Trzcinski, N. Palka, M. Szustakowski, Bull. Pol. Acad. Sci. Tech. 59, 445 (2011)
  • [11] L.M. Zur, G. Sundberg, S. Schecklman, Z. Zhou, A. Chen, E.I. Thorsos, Proc. SPIE 6949, 694907 (2008)
  • [12] C. Zhang, H. Zhong, L. Zhang, Proc. SPIE 7158, 71580Q (2008)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv122n516kz
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