Measuring the Energy Landscape in Single Semiconductor Nanowires

• Authors: L. Smith , H. Jackson , J. Yarrison-Rice , Ch. Jagadish
• Languages of publication: EN

Abstracts

EN

With the ability to design and control the physical structure of nanostructures to tune their electronic properties, it is increasingly important to measure the electronic structure of single nanostructures. Here we describe a number of experimental techniques for measuring the electronic structure of single semiconductor nanowires. The advantages, disadvantages and limitations of these methods will be described.

Keywords

EN

73.22.-f; 73.43.Fj; 73.50.Gr; 73.50.Pz; 73.63.-b; 78.30.Fs; 78.35.+c; 78.55.-m; 78.67.-n

Discipline

• 73.43.Fj: Novel experimental methods; measurements
• 73.63.-b: Electronic transport in nanoscale materials and structures(see also 73.23.-b Electronic transport in mesoscopic systems)
• 73.22.-f: Electronic structure of nanoscale materials and related systems
• 78.55.-m: Photoluminescence, properties and materials(for time resolved luminescence, see 78.47.jd)
• 73.50.Pz: Photoconduction and photovoltaic effects
• 73.50.Gr: Charge carriers: generation, recombination, lifetime, trapping, mean free paths
• 78.67.-n: Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures(for magnetic properties of nanostructures, see 75.75.-c; for electronic transport in nanoscale structures, see 73.63.-b; for mechanical properties of nanoscale systems, see 62.25.-g)
• 78.35.+c: Brillouin and Rayleigh scattering; other light scattering(for Raman scattering, see 78.30.-j; for time resolved light scattering spectroscopy, see 78.47.je)
• 78.30.Fs: III-V and II-VI semiconductors

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2012
• Volume: 122
• Issue: 2
• Pages: 316-320

Dates

published

2012-08

Contributors

author

L. Smith

• Department of Physics, University of Cincinnati, Cincinnati, Ohio 45221-0011, United States

author

H. Jackson

• Department of Physics, University of Cincinnati, Cincinnati, Ohio 45221-0011, United States

author

J. Yarrison-Rice

• Department of Physics, Miami University, Oxford, Ohio 45056, United States

author

Ch. Jagadish

• Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200, Australia

References

• 1. M. Law, J. Goldberger, P.D. Yang, Ann. Rev. Mater. Res. 34, 83 (2004)
• 2. Y.N. Xia, P.D. Yang, Y.G. Sun, Y.Y. Wu, B. Mayers, B. Gates, Y.D. Yin, F. Kim, Y.Q. Yan, Adv. Mater. 15, 353 (2003)
• 3. E.C. Garnett, M.L. Brongersma, Y. Cui, M.D. McGehee, Ann. Rev. Mater. Res. 41, 269 (2011)
• 4. P. Caroff, J. Bolinsson, J. Johansson, IEEE J. Sel. Top. Quant. Electron. 17, 829 (2011)
• 5. H.J. Joyce, Q. Gao, H.H. Tan, C. Jagadish, Y. Kim, J. Zou, L.M. Smith, H.E. Jackson, J.M. Yarrison-Rice, P. Parkinson, M.B. Johnston, Prog. Quant. Electron. 35, 23 (2011)
• 6. S. Barth, F. Hernandez-Ramirez, J.D. Holmes, A. Romano-Rodriguez, Prog. Mater. Sci. 55, 563 (2010)
• 7. D. Narducci, Sci. Adv. Mater. 3, 426 (2011)
• 8. M. Montazeri, M. Fickenscher, L.M. Smith, H.E. Jackson, J. Yarrison-Rice, J.H. Kang, Q. Gao, H.H. Tan, C. Jagadish, Y. Guo, J. Zou, M. Pistol, C.E. Pryor, Nano Lett. 10, 880 (2010)
• 9. R. Agarwal, Small 4, 1872 (2008)
• 10. M.E. Pistol, C.E. Pryor, Phys. Rev. B 78, 115319 (2008)
• 11. M.E. Pistol, C.E. Pryor, Phys. Rev. B 80, 035306 (2009)
• 12. A. Mishra, L.V. Titova, T.B. Hoang, H.E. Jackson, L.M. Smith, J.M. Yarrison-Rice, Y. Kim, H.J. Joyce, Q. Gao, H.H. Tan, C. Jagadish, Appl. Phys. Lett. 91, 263104 (2007)
• 13. S. Perera, K. Pemasiri, M.A. Fickenscher, H.E. Jackson, L.M. Smith, J. Yarrison-Rice, S. Paiman, Q. Gao, H.H. Tan, C. Jagadish, Appl. Phys. Lett. 97, 023106 (2010)
• 14. A. De, C.E. Pryor, Phys. Rev. B 81, 155210 (2010)
• 15. G.D. Gilliland, Mater. Sci. Eng. R: Reports R 18, 99 (1997)
• 16. K.P. Hewaparakrama, A. Wilson, S. Mackowski, H.E. Jackson, L.M. Smith, G. Karczewski, J. Kossut, Appl. Phys. Lett. 85, 5463 (2004)
• 17. T.B. Hoang, L.V. Titova, J.M. Yarrison-Rice, H.E. Jackson, A.O. Govorov, Y. Kim, H.J. Joyce, H.H. Tan, C. Jagadish, L.M. Smith, Nano Lett. 7, 588 (2007)
• 18. H. Rho, K.Y. Lee, T.B. Hoang, L.V. Titova, A. Mishra, L.M. Smith, H.E. Jackson, J.M. Yarrison-Rice, Y.J. Choi, K.J. Choi, J.G. Park, Appl. Phys. Lett. 92, 013111 (2008)
• 19. K. Pemasiri, M. Montazeri, R. Gass, L.M. Smith, H.E. Jackson, J. Yarrison-Rice, S. Paiman, Q. Gao, H.H. Tan, C. Jagadish, X. Zhang, J. Zou, Nano Lett. 9, 648 (2009)
• 20. J.M. Bao, D.C. Bell, F. Capasso, J.B. Wagner, T. Martensson, J. Tragardh, L. Samuelson, Nano Lett. 8, 836 (2008)
• 21. M.P. van Kouwen, M.E. Reimer, A.W. Hidma, M.H.M. van Weert, R.E. Algra, E. Bakkers, L.P. Kouwenhoven, V. Zwiller, Nano Lett. 10, 1817 (2010)
• 22. L.M. Smith, H.E. Jackson, J. Yarrison-Rice, C. Jagadish, Semicond. Sci. Technol. 25, 024010 (2010)
• 23. J. Wallentin, K. Mergenthaler, M. Ek, L.R. Wallenberg, L. Samuelson, K. Deppert, M. Pistol, M.T. Borgstrom, Nano Lett. 11, 2286 (2011)
• 24. M. Montazeri, L.M. Smith, H.E. Jackson, J.M. Yarrison-Rice, Y.J. Choi, J.G. Park, Appl. Phys. Lett. 95, 083105 (2009)
• 25. A. Abdi, L.V. Titova, L.M. Smith, H.E. Jackson, J.M. Yarrison-Rice, J.L. Lensch, L.J. Lauhon, Appl. Phys. Lett. 88, 043118 (2006)
• 26. B. Ketterer, M. Heiss, E. Uccelli, J. Arbiol, A. Fontcuberta i Morral, Acs Nano 5, 7585 (2011)
• 27. C. Soci, A. Zhang, X. Bao, H. Kim, Y. Lo, D. Wang, J. Nanosci. Nanotechnol. 10, 1430 (2010)
• 28. A. Maharjan, K. Pemasiri, P. Kumar, A. Wade, L.M. Smith, H.E. Jackson, J.M. Yarrison-Rice, A. Kogan, S. Paiman, Q. Gao, H.H. Tan, C. Jagadish, Appl. Phys. Lett. 94, 193115 (2009)
• 29. P. Kumar, A. Wade, L.M. Smith, H.E. Jackson, J.M. Yarrison-Rice, Y.J. Choi, J.G. Park, Appl. Phys. Lett. 98, 143102 (2011)
• 30. H.E. Ruda, A. Shik, Phys. Rev. B 72, 115308 (2005)
• 31. H.E. Ruda, A. Shik, J. Appl. Phys. 100, 024314 (2006)
• 32. J.F. Wang, M.S. Gudiksen, X.F. Duan, Y. Cui, C.M. Lieber, Science 293, 1455 (2001)
• 33. D. Zhang, J. Wu, Q. Lu, H.R. Gutierrez, P.C. Eklund, Nanotechnology 21, 315202 (2010)
• 34. H.J.W. Strutt, Philos. Mag. 41, 107 (1871)
• 35. M. Montazeri, A. Wade, M. Fickenscher, H.E. Jackson, L.M. Smith, J. Yarrison-Rice, Q. Gao, H.H. Tan, C. Jagadish, Nano Lett. 11, 4329 (2011)

Identifiers

DOI

10.12693/APhysPolA.122.316