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Number of results
2012 | 121 | 5-6 | 1179-1181
Article title

Exchange Bias in Ni-Mn-Sn Heusler Alloy Films

Content
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Languages of publication
EN
Abstracts
EN
We report a relatively large exchange bias effect observed for the first time in Ni-Mn-Sn thin films with different microstructure and composition: a Ni_{50}Mn_{36}Sn_{14} epitaxial film (A), a Ni_{50}Mn_{43}Sn_7 film which is phase decomposed (B), and a NiMn/Ni_{50}Mn_{25}Sn_{25} bilayer (C). Despite the samples differ markedly in both microstructure and composition H_{EB} does not substantially differs at 5 K. Exchange bias decreases with increasing T approximately as H_{EB} (T) ∝ H_{EB} (5K)/T with H_{EB} (5K) of 180 Oe and 60 Oe for sample B and C, respectively and almost linearly for sample A with H_{EB} (5K) = 65 Oe. Blocking temperature where the exchange bias vanishes is 40, 50 and 80 K for sample A, C and B, respectively. The results suggest that the role of AFM/FM interfaces is not substantial in formation of exchange bias in Ni-Mn-Sn Heusler alloy films and exchange bias is rather related to AFM/FM interactions in nanoscale.
Keywords
EN
Contributors
  • Department of Physics, A. Mickiewicz University, Umultowska 85, 61-614 Poznań, Poland
author
  • Institute of Molecular Physics, PAS, M. Smoluchowskiego 17, 60-179 Poznań, Poland
  • Institute of Molecular Physics, PAS, M. Smoluchowskiego 17, 60-179 Poznań, Poland
  • Institute of Metal Physics, NANU, Vernadsky Ave. 36, Kiev-142, Ukraine
author
  • Institute of Molecular Physics, PAS, M. Smoluchowskiego 17, 60-179 Poznań, Poland
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv121n5-6p57kz
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