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Number of results
2012 | 121 | 4 | 879-882

Article title

Local Structure Around Te in Heavily Doped GaAs:Te using X-Ray Absorption Fine Structure

Content

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Languages of publication

EN

Abstracts

EN
The annealing of heavily doped GaAs:Te can significantly change the free electron concentration in a reversible manner. These changes of electrical properties are accompanied by the structural changes of GaAs:Te solid solution. We used X-ray Absorption Fine Structure at K-edge of tellurium to determine local changes around Te atoms for different states of the GaAs:Te crystals caused by the annealing corresponding to different electron concentrations. The best EXAFS fit for the samples with high electron concentration was obtained for the substitutional Te_{As} model with elongated Te-Ga bonds (as compared to the As-Ga distance). For the samples in the low concentration state the best fit was for the pairs of Te atoms forming a rhombohedral symmetry double-DX centre, with the proportional admixture of the substitutional tellurium

Keywords

EN

Contributors

author
  • Warsaw University of Technology, Faculty of Physics, Koszykowa 75, Warszawa 00-662, Poland
author
  • Warsaw University of Technology, Faculty of Physics, Koszykowa 75, Warszawa 00-662, Poland
author
  • Warsaw University, Faculty of Physics, Hoża 69, Warszawa 00-681, Poland
author
  • Warsaw University of Technology, Faculty of Physics, Koszykowa 75, Warszawa 00-662, Poland
author
  • National Renewable Energy Laboratory (NREL), 1617 Cole Blvd, Golden, CO 80401, United States

References

  • 1. C.S. Fuller, K.B. Wolfstirn, J. Appl. Phys. 34, 2287 (1963)
  • 2. C.J. Hwang, J. Appl. Phys. 40, 4591 (1969)
  • 3. J. Borowski, J. Gronkowski, E. Rohozińska, T. Słupiński, J. Phys. D - Appl. Phys. 31, 1883, (1998)
  • 4. T. Słupiński, E. Zielińska-Rohozińska, Thin Solid Films 367, 221 (2000)
  • 5. K. Wuys, G. Langouche, M. Van Rossum, R.E. Silverans, Phys. Rev. B 45, 6297 (1992)
  • 6. J. Gebauer, E.R. Weber, N.D. Jaeger, K. Urban, Ph. Ebert Appl. Phys. Lett. 82, 2059 (2003)
  • 7. W.G. Pfann, Solid State Physics 4, 423 (1957)
  • 8. M. Newville, B. Ravel, D. Haskel, J.J. Rehr, E.A. Stern, Y. Yacoby, Physica B 208/209, 154 (1995)
  • 9. E.A. Stern, M. Newville, B. Ravel, Y. Yacoby, D. Haskel, Physica B 208/209, 117 (1995)
  • 10. L. Ankundinov, B. Ravel, J.J. Rehr, S.D. Conradson, Phys. Rev. B 58, 756 (1998)
  • 11. D.J. Chadi, Phys. Rev. B 46, 6777 (1992)
  • 12. C.H. Park, D.J. Chadi, Phys. Rev. B 54, 14246 (1996)
  • 13. G. Kresse, J. Furthmüller, Comput. Mat. Sci. 6, 15 (1996)
  • 14. P.E. Blöchl, Phys. Rev. B 50, 17953 (1994)

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv121n4p204kz
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