EN
In this work studies of structure and superconducting properties of VN-SiO_{2} films are reported. The films were obtained through thermal nitridation (ammonolysis) of sol-gel derived V_{2}O_{3}-SiO_{2} coatings (in a proper V_{2}O_{3}/SiO_{2} ratio) at 1200°C. This process leads to the formation of disordered structure with VN metallic grains dispersed in the insulating SiO_{2} matrix. The structural transformations occurring in the films as a result of ammonolysis were studied using X-ray photoelectron spectroscopy (XPS). The critical superconducting parameters are obtained. The magnetoresistance at high magnetic fields has been investigated.