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2012 | 121 | 1 | 53-55

Article title

Study of Ultrasonically Sprayed ZnO Films: Thermal Annealing Effect

Content

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Languages of publication

EN

Abstracts

EN
ZnO thin films were deposited on microscope glass substrates by ultrasonic spray pyrolysis technique. The effects of annealing under various temperatures on the optical and structural properties of ZnO thin films were analyzed. The as-deposited and annealed ZnO thin films were investigated by UV/VIS spectrophotometer and X-ray diffractometer. Some of the optical properties of the films such as transmittance, absorbance and band gap energy were investigated by UV/VIS spectrophotometer. The crystallinity levels of the films were investigated, the structural parameters such as diffraction angle, full-width at half maximum, lattice parameters, grain size and dislocation density were calculated and structural properties were analyzed. X-ray diffraction patterns indicated that the ZnO films had a polycrystalline hexagonal wurtzite structure.

Keywords

EN

Contributors

author
  • Physics Department, University of Canakkale Onsekiz Mart, 17020, Canakkale, Turkey
  • Physics Department, University of Canakkale Onsekiz Mart, 17020, Canakkale, Turkey
author
  • Physics Department, University of Canakkale Onsekiz Mart, 17020, Canakkale, Turkey
author
  • Physics Department, University of Canakkale Onsekiz Mart, 17020, Canakkale, Turkey
author
  • Physics Department, University of Canakkale Onsekiz Mart, 17020, Canakkale, Turkey

References

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  • 2. Y. Natsume, H. Sakata, Thin Solid Films 372, 30 (2000)
  • 3. L. Liao, H.B. Lu, M. Shuai, J.C. Li, Y.L. Liu, C. Liu, Z.X. Shen, T. Yu, Nanotechnology 19, 175501 (2008)
  • 4. T. Makino, Y. Segawa, H. Koinuma, M. Kawasaki, Appl. Phys. Lett. 77, 1632 (2000)
  • 5. K. Toooka, Thin Solid Films 445, 37 (2003)
  • 6. H.H. Afify, R.S. Momtaz, W.A. Badawy, S.A. Nasser, J. Mater. Electron. 2, 40 (1991)
  • 7. Z. Zhao, D.L. Morel, C.S. Ferekides, Thin Solid Films 413, 203 (2002)
  • 8. B.D. Cullity, The Elements of X-ray Diffraction, 2nd ed., Addison-Wesley, Reading, MA 1956
  • 9. Powder Diffraction File, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, PA, 1967, Card 0361451 (for ZnO hexagonal) and 40831 (for Zn hexagonal)
  • 10. J. Tauc, R. Grigorovich, A. Vancu, Phys. Status Solidi 15, 627 (1966)
  • 11. J.I. Pankove, Optical Process in Semiconductors, Solid State Physical Electronics Series, Prentice-Hall, NJ 1971, p. 422

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv121n115kz
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