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2012 | 121 | 1 | 33-35
Article title

Deposition and Characterization of CdS, CuS and ZnS Thin Films Deposited by SILAR Method

Content
Title variants
Languages of publication
EN
Abstracts
EN
Cadmium sulfide, copper sulfide and zinc sulfide films were grown on Si(111) substrate by successive ionic layer adsorption and reaction method at room temperature. The crystalline structure and morphology of obtained films were characterized by X-ray diffraction, scanning electronic microscope and energy dispersive X-ray analysis methods. The films were polycrystalline and showed preferred orientation. The surface morphology of these films looked relatively smooth and homogeneous in the scanning electron microscope image. The energy dispersive X-ray analysis spectra showed that the expected elements exist in the thin films.
Keywords
EN
Publisher

Year
Volume
121
Issue
1
Pages
33-35
Physical description
Dates
published
2012-01
Contributors
author
  • Department of Physics, Faculty of Sciences, University of Atatürk, Erzurum, Turkey
author
  • Department of Physics, Faculty of Sciences, University of Atatürk, Erzurum, Turkey
author
  • Department of Material Eng., Faculty of Eng. and Nature Sciences, University of Yıldırım Beyazıt, Ankara, Turkey
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv121n109kz
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