Structural and Optical Characterizations of~Ge Nanostructures Fabricated by~RF Magnetron Sputtering and Rapid Thermal Processing

• Authors: A. Abd Rahim , M. Hashim , M. Rusop , M. Jumidali
• Languages of publication: EN

Abstracts

EN

In this work, we use a simple and cost effective technique of sputtering followed by the rapid thermal processing at 900C for 30 s to form Ge nanostructures on the Si(100) substrate. A layer of Ge (300 nm) and Si cap layer (100 nm) were deposited using RF magnetron sputtering. Two samples were prepared: Ge layer with Si capping (Si/Ge/Si) and Ge layer without Si capping (Ge/Si). Scanning electron microscopy shows that subsequent annealing in a rapid thermal processing gives uniformed Ge or SiGe islands with an estimated size of 100-500 nm. For the Ge/Si sample, under post growth annealing there had vanished the deposited Ge layer as confirmed by energy dispersive X-ray analysis. Atomic force microscopy shows that the surface roughness increases by a factor of 15.55% as the islands formed. The Raman spectrum shows that good crystalline structures of the Ge and SiGe peaks are produced. High resolution X-ray diffraction reveals cubic and tetragonal Ge phases with estimated average crystallite sizes of 42 nm and 20 nm, respectively. The results showed that it is possible to grow high quality Ge and SiGe nanostructures using a simple technique of sputtering for potential applications in photonics and high speed devices.

Keywords

EN

68.55.ag; 68.60.Dv; 61.46.Hk; 78.67.Bf; 61.05.C-

Discipline

• 78.67.Bf: Nanocrystals, nanoparticles, and nanoclusters
• 68.60.Dv: Thermal stability; thermal effects
• 68.55.ag: Semiconductors
• 61.05.C-: X-ray diffraction and scattering(for x-ray diffractometers, see 07.85.Jy; for x-ray studies of crystal defects, see 61.72.Dd, Ff)
• 61.46.Hk: Nanocrystals

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2012
• Volume: 121
• Issue: 1
• Pages: 16-19

Dates

published

2012-01

Contributors

author

A. Abd Rahim

• Nano-Optoelectronics Research Laboratory, School of Physics, Universiti Sains Malaysia, 11800-Penang, Malaysia
• Faculty of Electrical Engineering, Universiti Teknologi MARA, 13500 Permatang Pauh, Pulau Pinang, Malaysia

author

M. Hashim

• Nano-Optoelectronics Research Laboratory, School of Physics, Universiti Sains Malaysia, 11800-Penang, Malaysia

author

M. Rusop

• Faculty of Electrical Engineering, Universiti Teknologi MARA, 40450 Shah Alamm, Selangor, Malaysia

author

M. Jumidali

• Nano-Optoelectronics Research Laboratory, School of Physics, Universiti Sains Malaysia, 11800-Penang, Malaysia
• Department of Applied Science, Universiti Teknologi MARA, 13500 Permatang Pauh, Pulau Pinang, Malaysia

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Identifiers

DOI

10.12693/APhysPolA.121.16