Influence of Chemical Composition of Liquid Phase and Growth Process on Physical Properties of Bi_2Se_3, Bi_2Te_3 and Bi_2Te_2Se Compounds

• Authors: A. Hruban , A. Materna , W. Dalecki , G. Strzelecka , M. Piersa , E. Jurkiewicz-Wegner , R. Diduszko , M. Romaniec , W. Orłowski
• Languages of publication: EN

Abstracts

EN

We studied synthesis and crystal growth of Bi_2Te_3, Bi_2Se_3 and Bi_2Te_2Se compounds by means of vertical Bridgman method. Crystals were grown from stoichiometric melts and under different molar ratio of Bi:Te, Bi:Se or Bi:Te:Se. The obtained crystals were characterized by X-ray diffraction analysis, energy dispersive X-ray spectroscopy, scanning electron microscopy, atomic force microscopy, and the Hall effect measurements. Some of the samples demonstrated insulating bulk behavior, by means of resistivity versus temperature measurements.

Keywords

EN

71.55.-i; 72.10.-d; 72.15.-v; 72.20.-I; 73.20.-r

Discipline

• 73.20.-r: Electron states at surfaces and interfaces
• 72.15.-v: Electronic conduction in metals and alloys
• 72.10.-d: Theory of electronic transport; scattering mechanisms
• 71.55.-i: Impurity and defect levels

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 120
• Issue: 5
• Pages: 950-953

Dates

published

2011-11

Contributors

author

A. Hruban

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

author

A. Materna

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

author

W. Dalecki

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

author

G. Strzelecka

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

author

M. Piersa

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

author

E. Jurkiewicz-Wegner

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

author

R. Diduszko

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

author

M. Romaniec

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

author

W. Orłowski

• Institute of Electronic Materials Technology, Wólczynska 133, 01-919 Warsaw, Poland

References

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Identifiers

DOI

10.12693/APhysPolA.120.950