Studies of Transport Properties of Single Layer Devices Based on the Polyazomethine Thin Films

• Authors: J. Weszka , M. Domański , J. Jurusik , B. Hajduk , M. Chwastek , H. Bednarski
• Languages of publication: EN

Abstracts

EN

This work reports results of studies on transport properties of single-layer devices based on polyazomethine thin films with different metal electrodes. Recorded I-V characteristics of Au-PPI-Au and Au-PPI-Al structures were analyzed in detail. It appears that I-V characteristics of Au-PPI-Au structures are consistent with the Mott-Gurney law with the mobility value of 2× 10^{-6} cm^2/(V s). Relatively low current in Au-PPI-Al devices is attributed to high value of the Schottky barrier and/or due to low density of longer conjugated segments in polyazomethine thin films.

Keywords

EN

73.40.Ei; 73.50.Pz

Discipline

• 73.50.Pz: Photoconduction and photovoltaic effects
• 73.40.Ei: Rectification

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 120
• Issue: 5
• Pages: 936-938

Dates

published

2011-11

Contributors

author

J. Weszka

• Centre of Polymer and Carbon Materials, Polish Academy of Sciences, M. Curie-Skłodowskiej 34, 41-819 Zabrze, Poland

author

M. Domański

• Centre of Polymer and Carbon Materials, Polish Academy of Sciences, M. Curie-Skłodowskiej 34, 41-819 Zabrze, Poland

author

J. Jurusik

• Centre of Polymer and Carbon Materials, Polish Academy of Sciences, M. Curie-Skłodowskiej 34, 41-819 Zabrze, Poland

author

B. Hajduk

• Centre of Polymer and Carbon Materials, Polish Academy of Sciences, M. Curie-Skłodowskiej 34, 41-819 Zabrze, Poland

author

M. Chwastek

• Centre of Polymer and Carbon Materials, Polish Academy of Sciences, M. Curie-Skłodowskiej 34, 41-819 Zabrze, Poland

author

H. Bednarski

• Centre of Polymer and Carbon Materials, Polish Academy of Sciences, M. Curie-Skłodowskiej 34, 41-819 Zabrze, Poland

References

• 1. S.-S. Sun, N.S. Sariciftci, Organic Photovoltaics: Mechnisms, Materials and Devices, Taylor&Francis Group, Broken Sound Parkway (NW) 2005
• 2. S. Gunes, H. Neugebauer, N.S. Sariciftci, Chem. Rev. 107, 1324 (2007)
• 3. A. Iwan, D. Sek, Prog. Polym. Sci. 33, 289 (2008)
• 4. J. Weszka, H. Bednarski, M. Domanski, J. Chem. Phys. 131, 024901 (2009)
• 5. J. Weszka, M. Domanski, B. Jarzabek, J. Jurusik, J. Cisowski, A. Burian, Thin Solid Films 516, 3098 (2008)
• 6. A. Uddin, C.B. Lee, X. Hu, T.K.S. Wong, Appl. Phys. A 78, 401 (2004)
• 7. D. Grozea, A. Turak, X.D. Feng, Z.H. Lu, D. Johnson, R. Wood, Appl. Phys. Lett. 81, 3173 (2002)
• 8. P.E. Burrows, Z. Shen, V. Bulovic, D.M. McCarty, R.S. Forrest, J.A. Cronin, M.E. Thomson, J. Appl. Phys. 79, 7991 (1996)
• 9. P.S. Davids, I.H. Campbell, D.L. Smith, J. Appl. Phys. 82, 6319 (1997)
• 10. A. Rose, Phys. Rev. 97, 1538 (1955)
• 11. M.A. Lampert, P. Mark, Current Injection in Solids, Academic, New York 1970
• 12. M. Kiy, P. Losio, I. Biaggio, M. Koehler, A. Tapponnier, P. Gunter, Appl. Phys. Lett. 80, 1198 (2002)
• 13. A.J. Campbell, D.D.C. Bradley, D.G. Lidzey, J. Appl. Phys. 82, 6326 (1997)

Identifiers

DOI

10.12693/APhysPolA.120.936