Polarization Sensitive Optical Coherence Tomography with Spectroscopic Analysis

• Authors: M. Strąkowski , J. Pluciński , B. Kosmowski
• Languages of publication: EN

Abstracts

EN

The optical coherence tomography is an optical measurement technique used for investigation of wide range of scattering or semitransparent materials. The optical coherence tomography enables surface and subsurface examination of different types of materials to be performed in non-contact and non-destructive way. Our research have been concentrated on optical coherence tomography systems with polarization sensitive analysis. Such a combination of optical measurements methods improves optical coherence tomography visualization contrast and also delivers some extra information about investigated devices. However, applying polarization sensitive analysis is associated with problems related to the use of ultra broadband optical sources. We have managed studies on the improvement of signal processing method. According to obtained results the problem of signal processing method in polarization sensitive optical coherence tomography can be solved by the use of the spectroscopic analysis. In this paper we present a brief discussion about the polarization sensitive optical coherence tomography measurements supported by spectroscopic analysis of backscattered light from investigated device.

Keywords

EN

42.79.-e; 42.87.-d; 42.79.Sz; 42.79.Ta

Discipline

• 42.79.Ta: Optical computers, logic elements, interconnects, switches; neural networks
• 42.87.-d: Optical testing techniques
• 42.79.-e: Optical elements, devices, and systems(for integrated optics, see 42.82.-m; for fiber optics, see 42.81.-i)
• 42.79.Sz: Optical communication systems, multiplexers, and demultiplexers(for fiber networks, see 42.81.Uv)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 120
• Issue: 4
• Pages: 785-788

Dates

published

2011-10

Contributors

author

M. Strąkowski

• Department of Optoelectronics and Electronic Systems, Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, G. Narutowicza 11/12, 80-233 Gdańsk, Poland

author

J. Pluciński

• Department of Optoelectronics and Electronic Systems, Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, G. Narutowicza 11/12, 80-233 Gdańsk, Poland

author

B. Kosmowski

• Department of Optoelectronics and Electronic Systems, Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, G. Narutowicza 11/12, 80-233 Gdańsk, Poland

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Identifiers

DOI

10.12693/APhysPolA.120.785