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Abstracts
The work presents the optical properties of porous silica thin films prepared by TEOS sol-gel method. The films were deposited onto glass substrate using dip-coating technique. The spectroscopic ellipsometry measurements have been performed to determine the optical constants of the films. This technique also enabled evaluation of the depolarization for the investigated layers. Additionally, the spectrophotometric measurements of transmittance and reflectance by the use of integrating sphere and reflectance probe have been made with the aim of possible application of the films as antireflective coatings.
Discipline
- 07.60.Fs: Polarimeters and ellipsometers
- 81.20.Fw: Sol-gel processing, precipitation(for reactions in sol-gels, see 82.33.Ln; for sol-gels as disperse system, see 82.70.Gg)
- 83.80.Jx: Reacting systems: thermosetting polymers, chemorheology, rheokinetics
- 07.60.Rd: Visible and ultraviolet spectrometers
Journal
Year
Volume
Issue
Pages
732-735
Physical description
Dates
published
2011-10
Contributors
author
- Institute of Physics, Cracow University of Technology, Podchorążych 1, 30-084 Kraków, Poland
author
- Institute of Physics, Cracow University of Technology, Podchorążych 1, 30-084 Kraków, Poland
author
- Department of Optoelectronics, Silesian University of Technology, B. Krzywoustego 2, 44-100 Gliwice, Poland
References
- 1. C.J. Brinker, G.W. Scherer, Sol-Gel Science: The Physics and Chemistry of Sol-Gel Processing, Academic Press, San Diego 1990
- 2. L. Li, L. Zhang, X. Yao, Ceram. Int. 30, 1842 (2004)
- 3. D.L. Plata, Y.J. Briones, R.L. Wolfe, M.K. Correll, S.D. Bakrania, S.G. Mandel, A.M. Andersen, J. Non-Cryst. Solids 350, 326 (2004)
- 4. R. Horvath, H.C. Pedersen, N. Skivensen, C. Svanberg, N.B. Larsen, J. Micromech. Microeng. 15, 1260 (2005)
- 5. M.C. Bautista, A. Morales, Solar Energy Mater. Solar Cells 80, 217 (2003)
- 6. K. Cathro, D. Constable, T. Solaga, Solar Energy 32, 572 (1984)
- 7. M. Born, E. Wolf, Principles of Optics, Pergamon Press, London 1959
- 8. H.E. Bennett, J.O. Porteus, Opt. Soc. Am. 51, 123 (1961)
- 9. R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam 1987
- 10. Complete Easy Data Analysis Manual, J.A. Woolam Co., June 15, 2008
- 11. D.E. Aspnes, Thin Solid Films 89, 249 (1982)
- 12. A. Springsteen, in: Applied Spectroscopy, Ed. J. Workmann , Vol. 1, Academic Press 1998, p. 205
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv120n436kz