Ellipsometric and Spectrophotometric Investigations of Porous Silica Thin Films Produced by Sol-Gel Method

• Authors: E. Skoczek , J. Jaglarz , P. Karasiński
• Languages of publication: EN

Abstracts

EN

The work presents the optical properties of porous silica thin films prepared by TEOS sol-gel method. The films were deposited onto glass substrate using dip-coating technique. The spectroscopic ellipsometry measurements have been performed to determine the optical constants of the films. This technique also enabled evaluation of the depolarization for the investigated layers. Additionally, the spectrophotometric measurements of transmittance and reflectance by the use of integrating sphere and reflectance probe have been made with the aim of possible application of the films as antireflective coatings.

Keywords

EN

81.20.Fw; 83.80.Jx; 07.60.Fs; 07.60.Rd

Discipline

• 07.60.Fs: Polarimeters and ellipsometers
• 81.20.Fw: Sol-gel processing, precipitation(for reactions in sol-gels, see 82.33.Ln; for sol-gels as disperse system, see 82.70.Gg)
• 83.80.Jx: Reacting systems: thermosetting polymers, chemorheology, rheokinetics
• 07.60.Rd: Visible and ultraviolet spectrometers

• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 120
• Issue: 4
• Pages: 732-735

Dates

published

2011-10

Contributors

author

E. Skoczek

• Institute of Physics, Cracow University of Technology, Podchorążych 1, 30-084 Kraków, Poland

author

J. Jaglarz

• Institute of Physics, Cracow University of Technology, Podchorążych 1, 30-084 Kraków, Poland

author

P. Karasiński

• Department of Optoelectronics, Silesian University of Technology, B. Krzywoustego 2, 44-100 Gliwice, Poland

References

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Identifiers

DOI

10.12693/APhysPolA.120.732