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2011 | 120 | 3 | 468-472
Article title

Structure Refinement of the Semiconducting Compound Cu_3TaS_4 from X-Ray Powder Diffraction Data

Content
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EN
Abstracts
EN
The ternary compound Cu_{3}TaS_{4} has been investigated by means of X-ray powder diffraction and its structure has been refined by the Rietveld method. This compound is isostructural with the sulvanite mineral Cu_{3}VS_{4}, and crystallizes in the cubic P \bar{4} 3m space group (No. 215), Z = 1, with unit cell parameters a = 5.5145(1) Å and V = 167.70(1) Å^{3}. The refinement of 14 instrumental and structural parameters converged to R_{p} = 4.4%, R_{wp} = 6.8%, R_{exp} = 5.5% and S = 1.2 for 4501 step intensities and 33 independent reflections.
Keywords
EN
Publisher

Year
Volume
120
Issue
3
Pages
468-472
Physical description
Dates
published
2011-09
received
2010-10-05
(unknown)
2011-04-01
Contributors
author
  • Laboratorio de Cristalografía, Departamento de Química, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela
author
  • Laboratorio de Cristalografía, Departamento de Química, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela
author
  • Laboratorio de Cristalografía, Departamento de Química, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela
author
  • Centro de Estudios de Semiconductores, Departamento de Física, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela
author
  • Centro de Estudios de Semiconductores, Departamento de Física, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela
  • Centro de Estudios de Semiconductores, Departamento de Física, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv120n318kz
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