PL EN


Preferences help
enabled [disable] Abstract
Number of results
2011 | 119 | 5 | 723-725
Article title

Observation of Thermally-Activated Electron Traps in GaAs/AlAs/GaAs Heterostructures in Low-Frequency Noise Measurements

Content
Title variants
Languages of publication
EN
Abstracts
EN
During our investigations of tunneling process in thin 7 nm thick GaAs/AlAs/GaAs vertical single-barrier tunneling structure with Si δ-doping inside the barrier we have observed fluctuations of the tunneling current which exhibited large Lorentzian noise with intensity depending on biasing voltage. We have shown that Lorentzian noise originates from multilevel random telegraph noise of the small number of fluctuators which influence the tunneling process. Time-domain analysis of the current noise measured for temperatures between 4.2 K and 50 K enabled to determine the thermal activation energies of these fluctuators lying between 0.8 and 3 meV.
Keywords
EN
Publisher

Year
Volume
119
Issue
5
Pages
723-725
Physical description
Dates
published
2011-05
Contributors
author
  • Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland
  • Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland
  • Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland
author
  • Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland
author
  • Laboratoire de Photonique et Nanostructures, CNRS, Marcoussis, France
author
  • Laboratoire de Photonique et Nanostructures, CNRS, Marcoussis, France
References
  • 1. M.J. Kirton, M.J. Uren, Adv. Phys. 38, 367 (1989)
  • 2. Sh. Kogan, Electronic Noise and Fluctuations in Solids, Cambridge University Press, Cambridge 1996
  • 3. J. Przybytek, M. Baj, Acta Phys. Pol. A 112, 221 (2007)
  • 4. J. Przybytek, M. Baj, Am. Inst. Phys. Conf. Proc. 1129, 333 (2009)
  • 5. M. Gryglas, M. Baj, B. Chenaud, B. Jouault, A. Cavanna, G. Faini, Phys. Rev. B 69, 165302 (2004)
  • 6. B. Jouault, M. Gryglas, G. Faini, U. Gennser, A. Cavanna, M. Baj, D.K. Maude, Phys. Rev. B 73, 155415 (2006)
  • 7. S. Lewińska, M. Gryglas-Borysiewicz, J. Przybytek, M. Baj, U. Gennser, A. Ouerghi, Acta Phys. Pol. A 119, 606 (2011)
  • 8. Y. Yuzhelevski, M. Yuzhelevski, G. Jung, Rev. Sci. Instrum. 71, 1681 (2000)
  • 9. G. Giusi, F. Crupi, C. Pace, Rev. Sci. Instrum. 79, 024701 (2008)
  • 10. T. Judd, N.R. Couch, P.H. Beton, M.J. Kelly, T.M. Kerr, M. Pepper, Appl. Phys. Lett. 49, 1652 (1986)
  • 11. M.H. Weichold, S.S. Villareal, R.A. Lux, Appl. Phys. Lett. 55, 657 (1989)
  • 12. Sze-Him Ng, Ch. Surya, E.R. Brown, P.A. Maki, Appl. Phys. Lett. 62, 2264 (1993)
  • 13. S.Y. Tzeng, M.J. Cich, R. Zhao, H. Feick, E.R. Weber, Appl. Phys. Lett. 82, 1063 (2003)
  • 14. R. Khlil, A. El Hdiy, Y. Jin, J. Appl. Phys. 98, 093709 (2005)
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv119n547kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.