Scanning-Gate Microscopy of Semiconductor Nanostructures: An Overview

• Authors: F. Martins , B. Hackens , H. Sellier , P. Liu , M. Pala , S. Baltazar , L. Desplanque , X. Wallart , V. Bayot , S. Huant
• Languages of publication: EN

Abstracts

EN

This paper presents an overview of scanning-gate microscopy applied to the imaging of electron transport through buried semiconductor nanostructures. After a brief description of the technique and of its possible artifacts, we give a summary of some of its most instructive achievements found in the literature and we present an updated review of our own research. It focuses on the imaging of GaInAs-based quantum rings both in the low magnetic field Aharonov-Bohm regime and in the high-field quantum Hall regime. In all of the given examples, we emphasize how a local-probe approach is able to shed new, or complementary, light on transport phenomena which are usually studied by means of macroscopic conductance measurements.

Keywords

EN

73.21.La; 73.23.Ad; 03.65.Yz; 85.35.Ds

Discipline

• 03.65.Yz: Decoherence; open systems; quantum statistical methods(see also 03.67.Pp in quantum information; for decoherence in Bose-Einstein condensates, see 03.75.Gg)
• 73.23.Ad: Ballistic transport
• 85.35.Ds: Quantum interference devices
• 73.21.La: Quantum dots

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2011
• Volume: 119
• Issue: 5
• Pages: 569-575

Dates

published

2011-05

Contributors

author

F. Martins

• IMCN, pôle NAPS, Université Catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium

author

B. Hackens

• IMCN, pôle NAPS, Université Catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium

author

H. Sellier

• Institut Néel, CNRS & Université Joseph Fourier, BP 166, F-38042 Grenoble, France

author

P. Liu

• Institut Néel, CNRS & Université Joseph Fourier, BP 166, F-38042 Grenoble, France

author

M. Pala

• IMEP-LAHC, UMR 5130, CNRS/INPG/UJF/UdS, Minatec, Grenoble, France

author

S. Baltazar

• IMEP-LAHC, UMR 5130, CNRS/INPG/UJF/UdS, Minatec, Grenoble, France

author

L. Desplanque

• IEMN, Cité Scientifique, Villeneuve d'Ascq, France

author

X. Wallart

• IEMN, Cité Scientifique, Villeneuve d'Ascq, France

author

V. Bayot

• IMCN, pôle NAPS, Université Catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium
• Institut Néel, CNRS & Université Joseph Fourier, BP 166, F-38042 Grenoble, France

author

S. Huant

• Institut Néel, CNRS & Université Joseph Fourier, BP 166, F-38042 Grenoble, France

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Identifiers

DOI

10.12693/APhysPolA.119.569