Title variants
Languages of publication
Abstracts
Microwave radar for non-destructive express testing of electrical properties of semiconductor materials which consists of pulsed magnet, transmitting and receiving antennas, high frequency generator, pulsed modulator and digital oscilloscope is described. In semiconductor specimen placed in pulsed magnetic field a magnetoplasmic wave is excited and propagated through the specimen. Delay time and attenuation of transmitted and reference signals are measured to find a value of concentration and mobility of free charge carriers in semiconductors. Experimental data of testing of InSb, n-InSb specimens are presented and acceptable for express testing correspondence of results was achieved.
Discipline
- 52.35.-g: Waves, oscillations, and instabilities in plasmas and intense beams(see also 94.20.wf Plasma waves and instabilities in physics of the ionosphere; 94.30.cq MHD waves, plasma waves, and instabilities in physics of the magnetosphere; 96.50.Tf MHD waves, plasma waves, turbulence in interplanetary physics)
- 72.80.Ey: III-V and II-VI semiconductors
- 07.57.Pt: Submillimeter wave, microwave and radiowave spectrometers; magnetic resonance spectrometers, auxiliary equipment, and techniques
- 07.55.Db: Generation of magnetic fields; magnets(for superconducting magnets, see 84.71.Ba; for beam focusing magnets, see 41.85.Lc in beam optics)
Journal
Year
Volume
Issue
Pages
537-541
Physical description
Dates
published
2011-04
Contributors
author
- Laboratory of High Magnetic Fields, Vilnius Gediminas Technical University, Naugarduko str. 41, ZP03227, Vilnius, Lithuania
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv119n414kz