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2011 | 119 | 4 | 537-541
Article title

Microwave Radar for Non-Destructive Express Testing of Electrical Properties of Semiconductor Materials

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EN
Abstracts
EN
Microwave radar for non-destructive express testing of electrical properties of semiconductor materials which consists of pulsed magnet, transmitting and receiving antennas, high frequency generator, pulsed modulator and digital oscilloscope is described. In semiconductor specimen placed in pulsed magnetic field a magnetoplasmic wave is excited and propagated through the specimen. Delay time and attenuation of transmitted and reference signals are measured to find a value of concentration and mobility of free charge carriers in semiconductors. Experimental data of testing of InSb, n-InSb specimens are presented and acceptable for express testing correspondence of results was achieved.
Keywords
Year
Volume
119
Issue
4
Pages
537-541
Physical description
Dates
published
2011-04
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv119n414kz
Identifiers
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